LPCOpen Platform for LPC112X microcontrollers  112X
LPCOpen Platform for the NXP LPC112X family of Microcontrollers
Data Fields
MEM_TEST_SETUP_T Struct Reference

Detailed Description

Memory test address/size and result structure.

Definition at line 47 of file mem_tests.h.

#include "mem_tests.h"

Data Fields

uint32_t * start_addr
 
uint32_t bytes
 
uint32_t * fail_addr
 
uint32_t is_val
 
uint32_t ex_val
 

Field Documentation

uint32_t bytes

Size in bytes for memory test

Definition at line 49 of file mem_tests.h.

uint32_t ex_val

Expected value of test (returned only if failed)

Definition at line 52 of file mem_tests.h.

uint32_t* fail_addr

Failed address of test (returned only if failed)

Definition at line 50 of file mem_tests.h.

uint32_t is_val

Failed value of test (returned only if failed)

Definition at line 51 of file mem_tests.h.

uint32_t* start_addr

Starting address for memory test

Definition at line 48 of file mem_tests.h.


The documentation for this struct was generated from the following file: