At NXP, we trace each product, by manufacturing lot, through the process of wafer fabrication, assembly and test (manufacturing) and warehouse and distribution. Each manufacturing lot’s history is then available for product research and containment.
We keep this product traceability data in a central storage and reporting database; available 24/7.
Trace data includes:
We can trace forward, backward and bidirectionally starting from any manufacturing record.
We can start tracing a specific unit using a combination of information:
Our tools enable us to quickly identify and contain impacted parts in case of an issue.