FREESCALE

Freescale Semiconductor, Inc.
Issuing Division: 8/16 BIT DIVISION ( JD )
PRODUCT BULLETIN
Generic Copy
18-JUN-2004


Subject:               FREESCALE PRODUCT BULLETIN 10026
TITLE:
RE-ISSUE TSPG 8/16 BIT 908KX8 ROOM TEST ELIM

EFFECTIVE DATE:        19-Jun-2004


AFFECTED CHANGE CATEGORIES
  • TEST PROCESS


    • AFFECTED PRODUCT DIVISIONS
  • COMPUTING PLATFORM DIVISION - CPD ( NR )
  • NETWORK & COMM SYS DIV - NCSD ( NB / NC / ND / NI / NM )
  • ANALOG PRODUCT DIVISION - APD ( JS )
  • DIGITAL AUDIO, RADIO & TELEMATICS DIVISION - DART ( JI )
  • 8/16 BIT DIVISION ( JD )
  • 32 BIT EMBEDDED CONTROLLER DIVISION - TECD ( JB )
  • RADIO PRODUCTS DIVISION - RPD ( VW )
  • WIRELESS SOLUTIONS DIVISION - WSD ( VC )
  • RADIO FREQUENCY DIVISION - RFD ( NH )

    • ADDITIONAL RELIABILITY DATA: Available
    REFERENCE: Contact Sales Office (RA7914)
    Contact your local Sales Office.

    SAMPLES: Contact Local Sales Office
    REFERENCE: Contact Sales Office ()
    Contact your local Sales Office.

    For any questions concerning this notification:
    REFERENCE: Contact Sales Office (JILL KLUCHER)

    DISCLAIMER
          DISCLAIMER:
         
          FREESCALE CONSIDERS THIS CHANGE APPROVED UNLESS SPECIFIC CONDITIONS
          OF ACCEPTANCE ARE PROVIDED IN WRITING. TO DO SO, CONTACT YOUR LOCAL
          SALES OFFICE.

    DO NOT REPLY TO THIS MESSAGE.
    GPCN FORMAT:           CUSTOMER

    DESCRIPTION AND PURPOSE

          *************************** NOTICE: *************************
         
          Due to a system distribution error the original distribution of
          Freescale Product Bulletin number 9783 may not have reached all of
          its intended recipients. In order to ensure that all customers
          receive a copy of this notification, we are re-issuing it as
          Freescale Product Bulletin number 10026. Because this notice is a
          Product Bulletin that announces a minor change that does not affect
          form, fit, or function, the effectivity date is the date of the
          original issue. We apologize if you have already received this
          notification.
         
         
          Freescale Semiconductor recently approved the following change to
          the product test flow for the 68HC908KX8 device from TSC6 (2L09H
          maskset) for all package types.
         
          The new test flow process will be probe, final hot test, final cold
          test, gate hot test, gate room test, and gate cold test --- room
          temperature testing will be eliminated.
         
          This change affects the following 908KX8 devices:
          KMC908KX8CDW
          MC68HC908KX8CDW
          MC68HC908KX8MDW
          MC68HC908KX8VDW
          MC908KX8CDWR2
          MC908KX8MDWR2
          MC908KX8VDWR2
          KMC908KX8CP
          MC68HC908KX8CP
          MC68HC908KX8MP
          MC68HC908KX8VPK
          MC908KX2CDW
          MC68HC908KX2CDW
          MC68HC908KX2MDW
          MC68HC908KX2VDW
          MC908KX2CDWR2
          KMC908KX2CP
          MC68HC908KX2CP
          MC68HC908KX2MP
          MC68HC908KX2VP
         
          This change will NOT impact custom part numbers, beginning with SC
          or SF. These devices currently include the following and test
          flows for these parts (beginning with SC, SF) WILL NOT CHANGE:
         
          SC510374CDW
          SC510374CDWR2
          SC510312CDW
          SC510312CDWR2
          SC510779CDW
          SC510779CDWR2
          SC510784CDW
          SC510784CDWR2
          SF100602CDW
          SF100602CDWR2
         
         
          Please contact local Freescale sales office for more information.
         
         
          REFERENCE PREVIOUS PRODUCT BULLETIN:
          9783 - TSPG 8/16 BIT 908KX8 ROOM TEST ELIM

    QUALIFICATION PLAN

          Greater than 6,000 devices from 3 non-consecutive wafers were tested
          at room and hot temperature.

    RELIABILITY DATA SUMMARY

          6,000 devices from 3 non-consecutive wafers were tested at hot
          temperature and then room temperature. Zero parts failed at room
          temperature.

    ELECTRICAL CHARACTERISTIC SUMMARY

          N/A

    CHANGED PART IDENTIFICATION

          None

    RELATED NOTIFICATIONS:
    TSPG 8/16 BIT 908KX8 ROOM TEST ELIM
    AFFECTED DEVICE LIST

    PART
    KMC908KX2CP
    KMC908KX8CDW
    KMC908KX8CP
    MC68HC908KX2CDW
    MC68HC908KX2CP
    MC68HC908KX2MDW
    MC68HC908KX2MP
    MC68HC908KX2VDW
    MC68HC908KX2VP
    MC68HC908KX8CDW
    MC68HC908KX8CP
    MC68HC908KX8MDW
    MC68HC908KX8MP
    MC68HC908KX8VDW
    MC908KX2CDWR2
    MC908KX8CDWR2
    MC908KX8MDWR2
    MC908KX8VDWR2