FREESCALE

 

Freescale Semiconductor, Inc.

Issuing Division: 8/16 BIT DIVISION ( JD )


PRODUCT BULLETIN

Generic Copy


07-OCT-2004



Subject:               FREESCALE PRODUCT BULLETIN 10363
TITLE:

MC QUAL OF MC9S12B128 (STURGEON)


EFFECTIVE DATE:        08-Oct-2004


AFFECTED CHANGE CATEGORIES

NEW PRODUCT QUALIFICATION



AFFECTED PRODUCT DIVISIONS

8/16 BIT DIVISION ( JD )

32 BIT EMBEDDED CONTROLLER DIVISION - TECD ( JB )


ADDITIONAL RELIABILITY DATA: Available
REFERENCE: Contact Sales Office (R23683)

Contact your local Sales Office.


SAMPLES: Contact Below
REFERENCE: Contact Sales Office (R38274)

Contact your local Sales Office.


For any questions concerning this notification:
REFERENCE: Contact Sales Office (MARK RENUCCI)

DISCLAIMER
      DISCLAIMER:
     
      FREESCALE CONSIDERS THIS CHANGE APPROVED UNLESS SPECIFIC CONDITIONS
      OF ACCEPTANCE ARE PROVIDED IN WRITING. TO DO SO, CONTACT YOUR LOCAL
      SALES OFFICE.

DO NOT REPLY TO THIS MESSAGE.
GPCN FORMAT:           CUSTOMER

DESCRIPTION AND PURPOSE

      Freescale Semiconductor are pleased to announce the MC qualification
      of the MC9S12B128 (Sturgeon) in the TSMC facility in Taiwan. This
      product has been qualified to the full automotive temperature
      specification range. Production volumes will be available from
      December 2004.
     
      New Mask : 3L80R
      Technology : 0.25 micron
      Wafer Fabrication: TSMC, Taiwan
      Assembly and Final Test : KLM
      Sample Availability : Now
     
      Mask Set Errata:
     
      Please note Errata have been identified on this device.
      A full listing of these Errata and workarounds is available
      at:
     
      http://www.freescale.com/files/microcontrollers/doc/errata/MSE9S12B12
      8_3L80R.pdf

QUALIFICATION PLAN

      See Reliabilty Summary Section below

RELIABILITY DATA SUMMARY

      112LQFP:
     
     
      HTOL:
      NVM W/E Cycling (10K flash, 100k EEPROM, 125C, 5.5v) - 0/240
      HTOL (1008hrs at 125C) - 0/240
     
      ET:
      NVM W/E Cycling (10K flash, 100k EEPROM, 125C, 5.5v) - 0/160
      Erased State Data Retention (1008hrs at 150C) - 0/160
     
      NVM W/E Cycling (10K flash and EEPROM, -40C, 5.5v) - 0/80
      Erased State Data Retention (1008hrs at 150C) - 0/80
     
      NVM W/E Cycling (10K flash, 100k EEPROM, 125C, 5.5v) - 0/80
      Programmed State Data Retention (1008hrs at 150C) - 0/80
     
      NVM W/E Cycling (10K flash and EEPROM, -40C, 5.5v) - 0/80
      Programmed State Data Retention (1008hrs at 150C) - 0/80
     
      ESD:
      HBM (500v; 1000v; 1500v; 2000v) - 0/12
      CDM (250v; 500V; 750V) - 0/9
      LU - 0/6
      GL - 0/6
     
      80QFP:
     
      ESD:
      HBM (500v; 1000v; 1500v; 2000v) - 0/12
      CDM (250v; 500V; 750V) - 0/9
      LU - 0/6
      GL - 0/6
     
      The full qualification report is available upon request.

ELECTRICAL CHARACTERISTIC SUMMARY

      Electrical Distribution results available upon request.

CHANGED PART IDENTIFICATION

      N/A


AFFECTED DEVICE LIST

 

PART

MC9S12B128CFU

MC9S12B128CPV

MC9S12B128MFU

MC9S12B128MPV

MC9S12B128VFU

MC9S12B128VPV

MC9SB128CFUR2

MC9SB128CPVR2

MC9SB128MFUR2

MC9SB128MPVR2

MC9SB128VFUR2

MC9SB128VPVR2

PC9S12B128CFU

PC9S12B128CFUR2

PC9S12B128CPV

PC9S12B128CPVR2

PC9S12B128FCFU

PC9S12B128FCFUR2

PC9S12B128FCPV

PC9S12B128FCPVR2

PC9S12B128FMFU

PC9S12B128FMFUR2

PC9S12B128FMPV

PC9S12B128FMPVR2

PC9S12B128FVFU

PC9S12B128FVFUR2

PC9S12B128FVPV

PC9S12B128FVPVR2

PC9S12B128MFU

PC9S12B128MFUR2

PC9S12B128MPV

PC9S12B128MPVR2

PC9S12B128VFU

PC9S12B128VFUR2

PC9S12B128VPV

PC9S12B128VPVR2

PC9S12B64CFU

PC9S12B64CFUR2

PC9S12B64CPV

PC9S12B64CPVR2

PC9S12B64MFU

PC9S12B64MFUR2

PC9S12B64MPV

PC9S12B64MPVR2

PC9S12B64VFU

PC9S12B64VFUR2

PC9S12B64VPV

PC9S12B64VPVR2

PC9S12B96CFU

PC9S12B96CFUR2

PC9S12B96CPV

PC9S12B96CPVR2

PC9S12B96MFU

PC9S12B96MFUR2

PC9S12B96MPV

PC9S12B96MPVR2

PC9S12B96VFU

PC9S12B96VFUR2

PC9S12B96VPV

PC9S12B96VPVR2