FREESCALE

Freescale Semiconductor, Inc.
Issuing Division: 8/16 BIT DIVISION ( JD )

PRODUCT AND PROCESS CHANGE NOTIFICATION
Generic Copy

20-APR-2005


Subject:               FREESCALE PRODUCT AND PROCESS CHANGE NOTIFICATION 10808
TITLE:
TSPG MCU ROOM TEST ELIM. MC68HC705C9A

EFFECTIVE DATE:        19-Jul-2005


AFFECTED CHANGE CATEGORIES
  • TEST PROCESS


  • AFFECTED PRODUCT DIVISIONS
  • COMPUTING PLATFORM DIVISION - CPD ( NR )
  • NETWORK & COMM SYS DIV - NCSD ( NB / NC / ND / NI / NM )
  • ANALOG PRODUCT DIVISION - APD ( JS )
  • DIGITAL AUDIO, RADIO & TELEMATICS DIVISION - DART ( JI )
  • 8/16 BIT DIVISION ( JD )
  • 32 BIT EMBEDDED CONTROLLER DIVISION - TECD ( JB )
  • RADIO PRODUCTS DIVISION - RPD ( VW )
  • WIRELESS SOLUTIONS DIVISION - WSD ( VC )
  • RADIO FREQUENCY DIVISION - RFD ( NH )

  • ADDITIONAL RELIABILITY DATA: Available
    REFERENCE: Contact Sales Office (R17472)
    Contact your local Sales Office.

    SAMPLES: Contact Below
    REFERENCE: Contact Sales Office (R31385)
    Contact your local Sales Office.

    For any questions concerning this notification:
    REFERENCE: Contact Sales Office (LAWRENCE LIU (ORIGINATOR))

    DISCLAIMER
          DISCLAIMER:
         
          FREESCALE WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC
          CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF
          RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL SALES OFFICE.

    DO NOT REPLY TO THIS MESSAGE.
    GPCN FORMAT:           CUSTOMER

    DESCRIPTION AND PURPOSE

          Freescale would like to announce the successful correlation of the
          elimination of ambient test from the final test flow on
          MC68HC705C9A in 44 PLCC package tested in KLM. The evaluation
          process has been successfully completed.
          The test flow will be changed to remove room test and keep the 100%
          Hot temperature test. QA gate tests are not affected by this
          change.
         
          Current Test flow:
          Probe1(25C)->Probe2(25C)->Final Hot test->Final Room test->QA gate
         
          Target Test flow:
          Probe1(25C)->Probe2(25C)->Final Hot test->QA gate
         
         

    QUALIFICATION PLAN

          Greater than 47k units with 0 fails from a minimum of 12 lots.
         
         
         

    RELIABILITY DATA SUMMARY

         
         
          Zero failure out of 59K samples from 18 separate lots was found
          after the removal of room test, with a failure rate no more than
          50PPM at 90% confidence level when sample size is bigger than 47K.
         
         
         

    ELECTRICAL CHARACTERISTIC SUMMARY

          Electrical characteristics will not be affected by the room test
          elimination.
         
         

    CHANGED PART IDENTIFICATION

          N/A
         
         
         


    AFFECTED DEVICE LIST

    PART
    MC68HC705C9ACFN
    MC68HC705C9AFN
    MC68HC705C9AVFN
    =======================================================================