PRODUCT AND PROCESS CHANGE NOTIFICATION
Generic Copy

ISSUE DATE:	23-Oct-2009
NOTIFICATION:	13903
TITLE:	9S12XDP512 (L15Y TSMC FAB) ROOM TEST ELIMINATION
EFFECTIVE DATE:	06-Nov-2009

DEVICE(S)

MPN
MC9S12XA512CAA
MC9S12XA512CAG
MC9S12XA512CAL
MC9S12XA512VAA
MC9S12XA512VAL
MC9S12XDP512CAG
MC9S12XDP512CAL
MC9S12XDP512MAG
MC9S12XDP512MAL
MC9S12XDP512VAG
MC9S12XDP512VAL
MC9S12XDT512CAA
MC9S12XDT512CAG
MC9S12XDT512CAL
MC9S12XDT512MAA
MC9S12XDT512MAG
MC9S12XDT512MAL
MC9S12XDT512VAL
S912XD128J1CAA
S912XD128J1CAAR
S912XD256J1CAG
S912XD256J1MAA
S912XD256J1VAG
S912XD256J1VAGR
S912XDG256J1VAG
S912XDG256J1VAGR
S912XDG512J1CAG
S912XDG512J1CAGR
S912XDP512J0CAL
S912XDP512J0CALR
S912XDP512J0MAG
S912XDP512J0MAL
S912XDP512J0VAL
S912XDP512J0VALR
S912XDP512J1CAA
S912XDP512J1CAAR
S912XDP512J1CAG
S912XDP512J1CAGR
S912XDP512J1CAL
S912XDP512J1CALR
S912XDP512J1MAG
S912XDP512J1MAGR
S912XDP512J1MAL
S912XDP512J1MALR
S912XDP512J1VAG
S912XDP512J1VAGR
S912XDP512J1VAL
S912XDT256J0VAL
S912XDT256J1MAL
S912XDT256J1VAL
S912XDT384J0CAG
S912XDT384J0CAGR
S912XDT384J1CAA
S912XDT384J1CAAR
S912XDT384J1CAG
S912XDT384J1CAGR
S912XDT384J1CAL
S912XDT384J1CALR
S912XDT384J1MAG
S912XDT384J1MAL
S912XDT384J1MALR
S912XDT384J1VAG
S912XDT384J1VAL
S912XDT384J1VALR
S912XDT512J0CAA
S912XDT512J0MAA
S912XDT512J1CAA
S912XDT512J1CAAR
S912XDT512J1CAG
S912XDT512J1CAGR
S912XDT512J1CAL
S912XDT512J1MAA
S912XDT512J1VAA
S912XDT512J1VAG
S912XDT512J1VAGR
S912XDT512J1VAL
SC104002VPV
SC104002VPVR2

AFFECTED CHANGE CATEGORIES

TEST PROCESS

DESCRIPTION OF CHANGE

Freescale is announcing the ROOM test elimination for the Final Test production flow for the 9S12XDP512 (L15Y mask set) for all market applications. The ROOM test is covered by the remaining Final Test COLD and HOT temperature production test(s).

This evaluation has been successfully completed according to Freescale specifications.

Original Production Final Test Flow: COLD Final Test - HOT Final Test - ROOM Final Test with In Line QA Gate Tests.

New Production Final Test Flow: COLD Final Test - HOT Final Test with In Line QA Gate Tests.

REASON FOR CHANGE

Improve capacity for optimized cycle time and delivery.

ANTICIPATED IMPACT OF PRODUCT CHANGE(FORM, FIT, FUNCTION, OR RELIABILITY)

None.

Freescale will consider specific conditions of acceptance of this change submitted within 30 days of receipt of this notice on a case by case basis. To request further data or inquire about samples, please enter a Service Request.

QUALIFICATION STATUS: NEW

QUALIFICATION PLAN:

To eliminate production tests, the acceptable number of failures using a minimum sample size of 100,000 units, is zero. The units are to be obtained from a minimum of 12 separate wafer lots, from the same fab, same mask set, each lot processed in a different time frame/day than others, over a nine week period of time, to make certain that all lots are non-consecutive.

RELIABILITY DATA SUMMARY:

This device is fully qualified. No further Reliability data is needed for this change.

ELECTRICAL CHARACTERISTIC SUMMARY:

The ROOM test elimination was successfully completed after testing 118k units, representing twelve different wafer lots, processed in the same wafer fabrication facility, same mask set, over a nine week period, with zero ROOM test failures.

CHANGED PART IDENTIFICATION:

There is no change to the orderable part number or marking.

ATTACHMENT(S):
External attachment(s) FOR this notification can be viewed AT:
13903_Room_Test_Elimination_Report_9S12XDP512_L15Y_Customer_Report.pdf