|TITLE:||MC33926PNB PQFN Cold Temperature Test Elimination|
Freescale Semiconductor announces the cold temperature test insertion elimination from the Final Test production flow of the MC33926PNB devices associated with this notification. Cold test is covered by the remaining production test flow insertions.
This evaluation has been successfully completed according to Freescale specifications.
Current Test Flow:
Room Temp Probe -> Hot Temp Test ->Cold Temp Test
Proposed Test Flow:
Room Temp Probe -> Hot Temp Test
Improve capacity for optimized cycle time and delivery.
There is no impact to device Form, Fit, Function or Reliability.
Freescale Semiconductor standard specification for Test Elimination was followed for this change. See attached Qualification Report.
No change to orderable part number.