MOTOROLA

                        Semiconductor Products Sector
                           Issuing Division: NCSG
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                              PRODUCT BULLETIN
                                Generic Copy
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                                 26-OCT-2000

Subject:	MOTOROLA PRODUCT BULLETIN 6013
TITLE:		TEST SITE TRANSFER FOR MC68EC020

EFFECTIVE DATE:	27-Oct-2000

AFFECTED CHANGE CATEGORIES

   * MOTOROLA TEST SITE

AFFECTED PRODUCT DIVISIONS

   * NETWORKING & COMMUNICATION SYSTEMS (NN)
   * IMAGING SYSTEMS DIV (LD)
   * WIRELESS COMMUNICATIONS DIV (VC)
   * ADVANCED VEHICLE SYS DIV (JB)
   * WIRELESS INFRASTRCT SYS DIV (NH
   * BODY ELECT, OCCUPANT SAFETY (JD
   * RF/IF DIV (VW)
   * CPD- COMPUTING PLATFORM DIVISION (NR)
   * IMAGING SYSTEM DIVISION (LZ)
   * ENTERTAINMENT SYSTEMS DIV (LB)
   * DRIVER INFORMATION DIVISION (JI)
   * High Performance Embedded System Division (AP)

ADDITIONAL RELIABILITY DATA: None
REFERENCE: Contact Sales Office ()

SAMPLES: Contact Local Sales Office
REFERENCE: Contact Sales Office ()

     Contact your local Motorola Sales Office.

For any questions concerning this notification:
REFERENCE: Contact Sales Office (MASAAKI KOSAKA)

DISCLAIMER
      DISCLAIMER:

      MOTOROLA CONSIDERS THIS CHANGE APPROVED UNLESS SPECIFIC CONDITIONS
      OF ACCEPTANCE ARE PROVIDED IN WRITING. TO DO SO, CONTACT YOUR LOCAL
      MOTOROLA SALES OFFICE.

DESCRIPTION AND PURPOSE

      Motorola is pleased to announce the transfer of the final test

      operations for MC68EC020 in 100QFP packages from Motorola
      subcontract final test site in Japan, GTI to Motorola Sendai final
      test site.
      In this time,the test site will be transfer on Motorola Sendai for
      increase of test capacity. Motorola would be able to access to
      bigger capacity of test,hence,Motorola can support higher production
      run rate.The transfer of test site does not involve any material
      change,assembly process would be tested in Motorola acording to
      device specification.

ELECTRICAL CHARACTERISTIC SUMMARY

      3 lots from the affected devices will be tested at GTI and Sendai.

      The data will be available on 10/25/00.

      Testing of production devices will not start until satisfactory
      correlation results have been achieved and Sendai test capability
      has been established. Final testing of the devices will then
      transfer to Sendai.

CHANGED PART IDENTIFICATION

      Newly qualified site parts can be identified by the test site code

      "SF".

ADDITIONAL INFORMATION

      At the beginning of transfer test site, the products will be ship
      with
      mix the test site code GTI as "DT" and Sendai "SF" by lot.

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AFFECTED DEVICE LIST
      PART
 MC68EC020CFG16
 MC68EC020FG16
 MC68EC020FG16B1
 MC68EC020FG16R2
 MC68EC020FG25
 MC68EC020FG25B1
 MC68EC020FG25R2
 SC414293CFG25
 SC414353FG16
 SC414363FG25
 SPAKEC020FG16
 SPAKEC020FG25