MOTOROLA

Semiconductor Products Sector
Issuing Division: MOTOROLA MICROCONTROLLERS DIV (AC

PRODUCT BULLETIN
Generic Copy

11-SEP-2002


Subject:               MOTOROLA PRODUCT BULLETIN 7998
TITLE:
ADD ASSEMBLY SITE ASE-CL FOR NEON LITE

EFFECTIVE DATE:        12-Sep-2002


AFFECTED CHANGE CATEGORIES
  • SUBCONTRACTOR ASSEMBLY SITE


  • AFFECTED PRODUCT DIVISIONS
  • BODY ELECT, OCCUPANT SAFETY (JD
  • DRIVER INFORMATION DIVISION (JI)
  • NETWORK & COMM SYS DIV (NB)
  • BRD. AND ENT. DIVISION BESD (VE)

  • ADDITIONAL RELIABILITY DATA: None
    REFERENCE: Contact Sales Office ()

    SAMPLES: Contact Local Sales Office
    REFERENCE: Contact Sales Office ()
    Contact your local Motorola Sales Office.

    For any questions concerning this notification:
    REFERENCE: Contact Sales Office (HENRY WONG)

    DISCLAIMER
          DISCLAIMER:
         
          MOTOROLA CONSIDERS THIS CHANGE APPROVED UNLESS SPECIFIC CONDITIONS
          OF ACCEPTANCE ARE PROVIDED IN WRITING. TO DO SO, CONTACT YOUR LOCAL
          MOTOROLA SALES OFFICE.

    DO NOT REPLY TO THIS MESSAGE.
    GPCN FORMAT:           CUSTOMER

    DESCRIPTION AND PURPOSE

          Motorola is pleased to announce an additional assembly site ASE-CL
          (Taiwan Chung Li) for the Neon Lite (MCVVQ111AFB) 48 LQFP 7x7
          package device. The package from ASE-CL will meet the same
          mechanical and electrical specifications of the package as those
          received from SHC (Hong Kong) and BAT-3 (TianJin).

    QUALIFICATION PLAN

          Ride on generic data from MC68HC908JB16FA. The qual plan of qual
          vechicle 908JB16 is as following:
         
          1) Pre-Conditioning - PC (per JA112 and J113), Moisture
          pre-conditioning for HAST, AC and TC, At Moisture Sensititivity
          Level (MSL) 1 at 240C
         
          ___Sample size - 1 lots of 231 units each
         
          ___Endpoint test temperatures - Room
         
          2) Highly Accelerated Stress Test - HAST (per JA101), 130C, 85
          percent RH, 96 hours
         
          ___Sample size - 1 lots of 77 units each
         
          ___Endpoint test temperatures - Room, Hot
         
          3) Autoclave - AC (per JA102), 121C, 100 percent RH, 15psig,
          96hours
         
          ___Sample size - 1 lots of 77 units each
         
          ___Endpoint test temperatures - Room
         
          4) Temp Cycle - TC (per JA104), -65C to 150C, 500 cycles
         
          ___Sample size - 1 lots of 77 units each
         
          ___Endpoint test temperatures - Room, Hot

    RELIABILITY DATA SUMMARY

          Qualification results from 908JB16:
         
         
          1) PC - 0/231,
         
          2) HAST - 0/77
         
          3) AC - 0/77
         
          4) TC - 0/77

    ELECTRICAL CHARACTERISTIC SUMMARY

          Electrical characteristics will not be affected by this change.

    CHANGED PART IDENTIFICATION

          For assembly site ASE-CL, the assembly site code (X) printed on the
          device for the traceability code will be changed accordingly.


    AFFECTED DEVICE LIST
    PART
    MCVVQ111AFB
    MCVVQ111FB