MOTOROLA

 

Semiconductor Products Sector

Issuing Division: SPS


PRODUCT AND PROCESS CHANGE NOTIFICATION

Generic Copy


27-JAN-2003


  
Subject:  MOTOROLA PRODUCT AND PROCESS CHANGE NOTIFICATION 8479
TITLE:

BARRACUDA AMBIENT TEST ELIMINATION


EFFECTIVE DATE:        14-Apr-2003


AFFECTED CHANGE CATEGORIES

·  TEST PROCESS



AFFECTED PRODUCT DIVISIONS

·  WIRELESS COMMUNICATIONS DIV (VC)

·  ADVANCED VEHICLE SYS DIV (JB)

·  WIRELESS INFRASTRCT SYS DIV (NH

·  BODY ELECT, OCCUPANT SAFETY (JD

·  RF/IF DIV (VW)

·  CPD- COMPUTING PLATFORM DIVISION (NR)

·  SMARTMOS PROD TECH CTR (JS

·  DRIVER INFORMATION DIVISION (JI)

·  NETWORK & COMM SYS DIV (NB)

·  BRD. AND ENT. DIVISION BESD (VE)


ADDITIONAL RELIABILITY DATA: None
REFERENCE: Contact Sales Office ()


SAMPLES: Contact Local Sales Office
REFERENCE: Contact Sales Office ()

Contact your local Motorola Sales Office.


For any questions concerning this notification:
REFERENCE: Contact Sales Office (ADRIEN MIME)

DISCLAIMER
      DISCLAIMER:
     
      MOTOROLA WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC
      CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF
      RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL MOTOROLA SALES
      OFFICE.

DO NOT REPLY TO THIS MESSAGE.
GPCN FORMAT:           CUSTOMER

DESCRIPTION AND PURPOSE

      Motorola SPS would like to inform customers of their intent to
      eliminate the Ambient Test Insertion of the production test program
      on its 0.25 Micron MC9SD12Dx256 (Mask Set: 1/2K79X) products
      family.
      This step is scheduled to be complete by WW13 2003 pending
      successful evaluation.
      All evaluations are being carried out on both 112 LQFP and 80QFP
      packaged products.
      QA gate tests are unaffected.
     
      An update notification will be issued with correlation results once
      evaluation is complete.

QUALIFICATION PLAN

      Evaluation Process
     
     
      1. Analyze failures from a minimum of 48,000 parts comprised
      of at least 12 final test lots (each lot from a separate wafer lot)
      of HC9S12Dx256.
      2. Achieve 100 percent correlation with hot or cold test on
      ambient failures by modification of test program on HC9S12Dx256.
      3. Eliminate ambient test on HC9S12Dx256.

RELIABILITY DATA SUMMARY

      Available on completion, estimated ww12/13 2003

ELECTRICAL CHARACTERISTIC SUMMARY

      NA

CHANGED PART IDENTIFICATION

      NA


AFFECTED DEVICE LIST

PART

EC9NDP256MPV25

KMC9S12A256BCFU

KMC9S12A256BCPV

KMC9S12DG256BCFU

KMC9S12DG256BCPV

KMC9S12DJ256BCFU

KMC9S12DJ256BCPV

KMC9S12DP256BCPV

KMC9S12DP256BMPV

KMC9S12DT256BCPV

MC9S12A256BCFU

MC9S12A256BCPV

MC9S12DG256BCFU

MC9S12DG256BCPV

MC9S12DG256BMFU

MC9S12DG256BMPV

MC9S12DG256BVFU

MC9S12DG256BVPV

MC9S12DG256CCFU

MC9S12DG256CCPV

MC9S12DG256CMFU

MC9S12DG256CMPV

MC9S12DG256CVFU

MC9S12DG256CVPV

MC9S12DJ256BCFU

MC9S12DJ256BCPV

MC9S12DJ256BMFU

MC9S12DJ256BMPV

MC9S12DJ256BVFU

MC9S12DJ256BVPV

MC9S12DJ256CCFU

MC9S12DJ256CCPV

MC9S12DJ256CMFU

MC9S12DJ256CMPV

MC9S12DJ256CVFU

MC9S12DJ256CVPV

MC9S12DP256BCPV

MC9S12DP256BMPV

MC9S12DP256BVPV

MC9S12DP256CCPV

MC9S12DP256CMPV

MC9S12DP256CVPV

MC9S12DT256BCPV

MC9S12DT256BMPV

MC9S12DT256BVPV

MC9S12DT256CCPV

MC9S12DT256CMPV

MC9S12DT256CVPV

MC9SA256BCFUR2

MC9SA256BCPVR2

MC9SDG256BCFUR2

MC9SDG256BMFUR2

MC9SDG256BVFUR2

MC9SDG256CCFUR2

MC9SDG256CCPVR2

MC9SDG256CMFUR2

MC9SDG256CMPVR2

MC9SDG256CVFUR2

MC9SDG256CVPVR2

MC9SDJ256BCFUR2

MC9SDJ256BMFUR2

MC9SDJ256BVFUR2

MC9SDJ256CCFUR2

MC9SDJ256CCPVR2

MC9SDJ256CMFUR2

MC9SDJ256CMPVR2

MC9SDJ256CVFUR2

MC9SDJ256CVPVR2

MC9SDP256BCPVR2

MC9SDP256BMPVR2

MC9SDP256BVPVR2

MC9SDP256CCPVR2

MC9SDP256CMPVR2

MC9SDP256CVPVR2

MC9SDT256BCFUR2

MC9SDT256CCPVR2

MC9SDT256CMPVR2

MC9SDT256CVPVR2

PC9S12DG256CPV25

PC9S12DG256MPV25

PC9S12DG256VPV25

 

PART

PC9S12DJ256CPV25

PC9S12DJ256MFU25

PC9S12DJ256MPV25

PC9S12DJ256VPV25

PC9S12DP256CPV25

PC9S12DP256MPV25

PC9S12DP256VPV25

PC9S12DT256CPV25

PC9S12DT256MPV25

PC9S12DT256VPV25

PC9SDJ256MFU25R2

PC9SDP256MPV25

PC9SDP256MPV25R2

SC511347BCFU

SC511347BCFUR2

SC511347BCPV

SC511347BCPVR2

SC511347BMFU

SC511347BMFUR2

SC511347BMPV

SC511347BMPVR2

SC511347BVFU

SC511347BVFUR2

SC511347BVPV

SC511347BVPVR2