MOTOROLA

 

Semiconductor Products Sector

Issuing Division: TSG


PRODUCT AND PROCESS CHANGE NOTIFICATION

Generic Copy


27-JAN-2003


  
Subject:     MOTOROLA PRODUCT AND PROCESS CHANGE NOTIFICATION 8480
TITLE:

MARLIN AMBIENT TEST ELIMINATION


EFFECTIVE DATE:        27-Apr-2003


AFFECTED CHANGE CATEGORIES

·  TEST PROCESS



AFFECTED PRODUCT DIVISIONS

·  ADVANCED VEHICLE SYS DIV (JB)

·  WIRELESS INFRASTRCT SYS DIV (NH

·  BODY ELECT, OCCUPANT SAFETY (JD

·  CPD- COMPUTING PLATFORM DIVISION (NR)

·  SMARTMOS PROD TECH CTR (JS

·  DRIVER INFORMATION DIVISION (JI)

·  NETWORK & COMM SYS DIV (NB)


ADDITIONAL RELIABILITY DATA: None
REFERENCE: Contact Sales Office ()


SAMPLES: Contact Local Sales Office
REFERENCE: Contact Sales Office ()

Contact your local Motorola Sales Office.


For any questions concerning this notification:
REFERENCE: Contact Sales Office (GRAEME MITCHELL)

DISCLAIMER
      DISCLAIMER:
     
      MOTOROLA WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC
      CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF
      RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL MOTOROLA SALES
      OFFICE.


DO NOT REPLY TO THIS MESSAGE.
GPCN FORMAT:           CUSTOMER

DESCRIPTION AND PURPOSE

      Motorola SPS would like to inform customers of their intent to
      eliminate the Ambient Test Insertion of the production test program
      on its 0.25 Micron MC9SD12Dx128 (Mask Set: 0/1L85D) products
      family.
      This step is scheduled to be complete by WW17 2003 pending
      successful evaluation.
      Evaluation will be carried out on both 80LQFP and 112LQFP within the
      47K sample.
      QA gate tests are unaffected.
     
      An update notification will be issued with correlation results once
      evaluation is complete.

QUALIFICATION PLAN

      Evaluation Process
     
     
      1.
Analyze failures from a minimum of 47K final test parts.
      Parts will be from at least 12 HC9S12Dx128 wafer lots that have been
      processed in fab over a period of at least 9 weeks.
      2. Achieve 100 percent correlation with hot or cold test on
      ambient failures by modification of test program on HC9S12Dx128.
      3. Eliminate ambient test on HC9S12Dx128 when we have zero
      fails over 47K as described in part 1.

RELIABILITY DATA SUMMARY

      Available on completion, estimated WW17 2003

ELECTRICAL CHARACTERISTIC SUMMARY

      NA

CHANGED PART IDENTIFICATION

      NA


AFFECTED DEVICE LIST

PART

EC9N12DB128CPV25

KMC9S12A128BCFU

KMC9S12A128BCPV

KMC9S12DJ128BCPV

MC9S12A128BCFU

MC9S12A128BCPV

MC9S12DB128BCPV

MC9S12DB128BMPV

MC9S12DB128BVPV

MC9S12DG128BCFU

MC9S12DG128BCPV

MC9S12DG128BMFU

MC9S12DG128BMPV

MC9S12DG128BVFU

MC9S12DG128BVPV

MC9S12DJ128BCFU

MC9S12DJ128BCPV

MC9S12DJ128BMFU

MC9S12DJ128BMPV

MC9S12DJ128BVFU

MC9S12DJ128BVPV

MC9S12DT128BCPV

MC9S12DT128BMPV

MC9S12DT128BVPV

MC9SDB128BCPVR2

MC9SDB128BMPVR2

MC9SDB128BVPVR2

MC9SDG128BCFUR2

MC9SDG128BCPVR2

MC9SDG128BMFUR2

MC9SDG128BMPVR2

MC9SDG128BVFUR2

MC9SDG128BVPVR2

MC9SDJ128BCFUR2

MC9SDJ128BCPVR2

MC9SDJ128BMFUR2

MC9SDJ128BMPVR2

MC9SDJ128BVFUR2

MC9SDJ128BVPVR2

MC9SDT128BCPVR2

MC9SDT128BMPVR2

MC9SDT128BVPVR2

PC9S12DB128CFU25

PC9S12DB128CPV25

PC9S12DB128MFU25

PC9S12DB128MPV25

PC9S12DB128VFU25

PC9S12DB128VPV25

PC9S12DB128VPV8

PC9S12DG128CFU25

PC9S12DG128CPV25

PC9S12DG128MFU25

PC9S12DG128MPV25

PC9S12DG128VFU25

PC9S12DG128VPV25

PC9S12DJ128CFU25

PC9S12DJ128CPV25

PC9S12DJ128MFU25

PC9S12DJ128MPV25

PC9S12DJ128VFU25

PC9S12DJ128VPV25

PC9S12DT128CPV25

PC9S12DT128MPV25

PC9S12DT128VPV25