MOTOROLA

Semiconductor Products Sector
Issuing Division: BODY ELECT, OCCUPANT SAFETY (JD

PRODUCT AND PROCESS CHANGE NOTIFICATION
Generic Copy

31-JAN-2003


Subject:               MOTOROLA PRODUCT AND PROCESS CHANGE NOTIFICATION 8504
TITLE:
COLD TEST ELIMN ON 0.65U ROM PRODUCTS

EFFECTIVE DATE:        12-May-2003


AFFECTED CHANGE CATEGORIES
  • TEST PROCESS


  • AFFECTED PRODUCT DIVISIONS
  • ADVANCED VEHICLE SYS DIV (JB)
  • WIRELESS INFRASTRCT SYS DIV (NH
  • BODY ELECT, OCCUPANT SAFETY (JD
  • RF/IF DIV (VW)
  • CPD- COMPUTING PLATFORM DIVISION (NR)
  • DRIVER INFORMATION DIVISION (JI)
  • NETWORK & COMM SYS DIV (NB)
  • BRD. AND ENT. DIVISION BESD (VE)

  • ADDITIONAL RELIABILITY DATA: Not Available
    REFERENCE: Contact Sales Office ()

    SAMPLES: Contact Local Sales Office
    REFERENCE: Contact Sales Office ()
    Contact your local Motorola Sales Office.

    For any questions concerning this notification:
    REFERENCE: Contact Sales Office (ALLAN SCOTT)

    DISCLAIMER
          DISCLAIMER:
         
          MOTOROLA WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC
          CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF
          RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL MOTOROLA SALES
          OFFICE.

    DO NOT REPLY TO THIS MESSAGE.
    GPCN FORMAT:           CUSTOMER

    DESCRIPTION AND PURPOSE

          Motorola SPS would like to give advance notification of its intent
          to evaluate elimination of 100 percent production cold test (-40C)
          on the 0.65U HC12D60, HC12DA128, HC12DG128, HC12BE32 and HC812A4
          products manufactured in MOS12 and KLM facilities.

    QUALIFICATION PLAN

          1.Analyze failures from a minimum of 46K devices taken from 12
          separate wafer lots from the following products: HC12D60 (80 and
          112 QFP), HC12DG128, HC12DA128, HC12BE32, HC812A4.
         
          2.At least 11K of product will be run on all of the devices except
          the 80 QFP HC912D60 which will be covered by 112 QFP HC912D60 and
          the HC12DA128 which will be covered by the HC12DG128.
         
          3.Achieve 100 percent correlation with ambient test on cold failures
          by modification of test program.
         
          4.Validate with 100 percent correlation (0 failures) on a further 10
          lots of each mask set at cold.
         
          5.Eliminate cold test on HC12D60 (both 80 and 112 QFP), HC12DG128,
          HC12DA128, HC12BE32 and HC812A4.
         
          6.QA gate tests are unaffected.
         
          7.A Product Bulletin will be issued once evaluation is complete to
          provide an update on results and cold test elimination
          implementation schedule. If any further information or
          clarification is required at this time please do not hesitate to
          contact your Motorola Field Sales or Field Quality Representative.

    RELIABILITY DATA SUMMARY

          N/A

    ELECTRICAL CHARACTERISTIC SUMMARY

          N/A

    CHANGED PART IDENTIFICATION

          None


    AFFECTED DEVICE LIST
    PART
    MC68HC812A4CPV8
    SC551855CPV8