MOTOROLA

Semiconductor Products Sector
Issuing Division: 8/16 BIT DIVISION

PRODUCT AND PROCESS CHANGE NOTIFICATION
Generic Copy

12-DEC-2003


Subject:               MOTOROLA PRODUCT AND PROCESS CHANGE NOTIFICATION 9444
TITLE:
MC9S12DX128/DX128E AMB TEST ELIMINATION

EFFECTIVE DATE:        11-Mar-2004


AFFECTED CHANGE CATEGORIES
  • TEST PROCESS


  • AFFECTED PRODUCT DIVISIONS
  • ADVANCED VEHICLE SYS DIV (JB)
  • BODY ELECT, OCCUPANT SAFETY (JD
  • COMPUTING PLATFORM DIVISION - CPD
  • SMARTMOS PROD TECH CTR (JS
  • DRIVER INFORMATION DIVISION (JI)
  • 8/16 BIT DIVISION

  • ADDITIONAL RELIABILITY DATA: Available
    REFERENCE: Contact Sales Office (R14553)
    Contact your local Motorola Sales Office.

    SAMPLES: Contact Local Sales Office
    REFERENCE: Contact Sales Office ()
    Contact your local Motorola Sales Office.

    For any questions concerning this notification:
    REFERENCE: Contact Sales Office (EDWARD YAM)

    DISCLAIMER
          DISCLAIMER:
         
          MOTOROLA WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC
          CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF
          RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL MOTOROLA SALES
          OFFICE.

    DO NOT REPLY TO THIS MESSAGE.
    GPCN FORMAT:           CUSTOMER

    DESCRIPTION AND PURPOSE

          Further to PCN 8941, Motorola SPS would like to announce the
          successful correlation of the elimination of ambient test from the
          final test flow on the MC9S12Dx128(3L40K) /Dx128E(1L40K).
         
          The evaluation process has been successfully completed according to
          Motorola specification 12MRE10539D, with all criteria met. The
          results of this exercise are summarized below.
         
          Qualification was carried out successfuly for MC9S12Dx128/Dx128E
          with 0 fail from 50,439 tested units.
         
          The test flow will be changed to remove 100 percent ambient test.
          The production final Test Flow will now be 100 percent Burn-In, 100
          percent Hot Test, 100 percent Cold Test and QA Gate Sampling Plan.

    QUALIFICATION PLAN

          The following steps were carried out separately for both MC9S12Dx128
          and MC9S12Dx128E:
         
          1. Analyze failures from a minimum of 46,052 parts from at least 12
          wafer lots.
         
          2. Ensure all ambient test failures from existing test flow are
          captured as failures in ambient eliminated test flow.
         
          3. Eliminate ambient test on MC9S12Dx256 and MC9S12Dx128 after
          customer notification.

    RELIABILITY DATA SUMMARY

          N/A

    ELECTRICAL CHARACTERISTIC SUMMARY

          MC9S12Dx128 and MC9S12Dx128E ambient test elimination was validated
          using 50,439 devices taken from 13 wafer lots.
         
          Validation product consisted of a representative mixture of both
          1L40K and 3L40K masksets.
         
          100 percent correlation of ambient fails was achieved to the revised
          test flow.

    CHANGED PART IDENTIFICATION

          N/A


    AFFECTED DEVICE LIST
    PART
    MC9S12A128CFU
    MC9S12A128CPV
    MC9S12DB128CFU
    MC9S12DB128CPV
    MC9S12DB128CPVR2
    MC9S12DB128MFU
    MC9S12DB128MPV
    MC9S12DB128MPVE
    MC9S12DB128MPVR2
    MC9S12DB128VFU
    MC9S12DB128VPV
    MC9S12DB128VPVE
    MC9S12DB128VPVR2
    MC9S12DB64CFU
    MC9S12DB64MFU
    MC9S12DB64VFU
    MC9S12DG128CFU
    MC9S12DG128CFUR2
    MC9S12DG128CPV
    MC9S12DG128CPVR2
    MC9S12DG128MFU
    MC9S12DG128MFUR2
    MC9S12DG128MPV
    MC9S12DG128MPVR2
    MC9S12DG128VFU
    MC9S12DG128VFUR2
    MC9S12DG128VPV
    MC9S12DG128VPVR2
    MC9S12DJ128CFU
    MC9S12DJ128CFUR2
    MC9S12DJ128CPV
    MC9S12DJ128CPVR2
    MC9S12DJ128MFU
    MC9S12DJ128MFUR2
    MC9S12DJ128MPV
    MC9S12DJ128MPVR2
    MC9S12DJ128VFU
    MC9S12DJ128VFUR2
    MC9S12DJ128VPV
    MC9S12DJ128VPVR2
    MC9S12DT128CPV
    MC9S12DT128CPVR2
    MC9S12DT128MPV
    MC9S12DT128VPV
    MC9SDG128ECFU
    MC9SDG128ECFUR2
    MC9SDG128ECPV
    MC9SDG128ECPVR2
    MC9SDG128EMFU
    MC9SDG128EMFUR2
    MC9SDG128EMPV
    MC9SDG128EMPVR2
    MC9SDG128EVFU
    MC9SDG128EVFUR2
    MC9SDG128EVPV
    MC9SDG128EVPVR2
    MC9SDJ128ECFU
    MC9SDJ128ECFUR2
    MC9SDJ128ECPV
    MC9SDJ128ECPVR2
    MC9SDJ128EMFU
    MC9SDJ128EMFUR2
    MC9SDJ128EMPV
    MC9SDJ128EMPVR2
    MC9SDJ128EVFU
    MC9SDJ128EVFUR2
    MC9SDJ128EVPV
    MC9SDJ128EVPVR2
    MC9SDT128ECPV
    MC9SDT128EMPV
    MC9SDT128EVPV
    SC542015CPVR2
    SC542017CPV
    SC542017CPVR2
    SC542018CPV
    SC542018CPVR2