LPCOpen Platform for LPC112X microcontrollers
112X
LPCOpen Platform for the NXP LPC112X family of Microcontrollers
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mem_tests.h
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/*
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* @brief Generic memory tests
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* Various memory tests for testing external memory integrity. Includes
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* inverse address, walking bit, and pattern tests.
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*
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* @note
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* Copyright(C) NXP Semiconductors, 2012
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* All rights reserved.
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*
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* @par
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* Software that is described herein is for illustrative purposes only
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* which provides customers with programming information regarding the
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* LPC products. This software is supplied "AS IS" without any warranties of
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* any kind, and NXP Semiconductors and its licensor disclaim any and
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* all warranties, express or implied, including all implied warranties of
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* merchantability, fitness for a particular purpose and non-infringement of
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* intellectual property rights. NXP Semiconductors assumes no responsibility
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* or liability for the use of the software, conveys no license or rights under any
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* patent, copyright, mask work right, or any other intellectual property rights in
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* or to any products. NXP Semiconductors reserves the right to make changes
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* in the software without notification. NXP Semiconductors also makes no
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* representation or warranty that such application will be suitable for the
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* specified use without further testing or modification.
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*
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* @par
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* Permission to use, copy, modify, and distribute this software and its
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* documentation is hereby granted, under NXP Semiconductors' and its
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* licensor's relevant copyrights in the software, without fee, provided that it
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* is used in conjunction with NXP Semiconductors microcontrollers. This
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* copyright, permission, and disclaimer notice must appear in all copies of
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* this code.
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*/
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#ifndef __MEM_TESTS_H_
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#define __MEM_TESTS_H_
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#include "
lpc_types.h
"
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typedef
struct
{
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uint32_t *
start_addr
;
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uint32_t
bytes
;
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uint32_t *
fail_addr
;
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uint32_t
is_val
;
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uint32_t
ex_val
;
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}
MEM_TEST_SETUP_T
;
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bool
mem_test_walking0
(
MEM_TEST_SETUP_T
*pMemSetup);
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bool
mem_test_walking1
(
MEM_TEST_SETUP_T
*pMemSetup);
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bool
mem_test_address
(
MEM_TEST_SETUP_T
*pMemSetup);
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bool
mem_test_invaddress
(
MEM_TEST_SETUP_T
*pMemSetup);
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bool
mem_test_pattern
(
MEM_TEST_SETUP_T
*pMemSetup);
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bool
mem_test_pattern_seed
(
MEM_TEST_SETUP_T
*pMemSetup, uint32_t seed, uint32_t incr);
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#endif
/* __MEM_TESTS_H_ */
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