About This Training
NAND flash has a functional lifetime that is constrained by flash endurance. Proper consideration and estimation of the storage device life cycle are critical. This is particularly important for embedded systems with high operational uptime and long life cycles. This presentation will discuss factors that influence device age, and the methods for estimating device lifetime, strategies for boosting device life. Additionally, the considerations for validating actual device lifetime estimates during the prototype phase, and ways to monitor device age once in-field are also going to be covered. We will conclude the session with some of the ready-to-go solutions from NXP's partners.
Topics in this webinar:
- eMMC devices
- Associated memory devices (DDR3L, eMCP, LPDDR4, ,etc.)
- NXP’s Arm-based processors
Free memory/storage samples available at NXP@Kingston.com, design guidance, white papers, useful collateral and budgetary price trend.