201701031F01 : MCF52254AF80 Room Test Elimination at Final Test
NXP Semiconductors announces the room temperature test elimination from the Final Test production flow for MCF52254AF80. Room test performance is covered by the remaining Final Test production flow. The room test elimination has been successfully qualified according to NXP specifications.Current Production Final Test Flow:Hot - Room - QA gateNew Production Final Test Flow:Hot - QA gate
| PCN Type | Change Category | Issue Date | Effective Date |
|---|---|---|---|
| Final Product Change Notification | Test process | 25-Mar-2017 | 23-Jun-2017 |
Reason of Change
Improve capacity for optimized cycle time and delivery.
Identification of Affected Products
Product identification does not change
Anticipated Impact
There is no change to product form fit function or reliability
Affected Parts
| Part Number / 12NC | Last Time Buy Date | Last Time Delivery Date | Replacement Part |
|---|---|---|---|
|
MCF52254AF80 (935309316557) |
- | - | - |