The content of this page reflects a large part of our standard processing, however there may be exceptions. Please contact us if further clarification is needed.

At NXP, we perform accelerated stress tests during process certification to:

  • Find potential failure mechanisms
  • Eliminate their root causes prior to product development

Stress tests are also done during product qualification to check for potential failure mechanisms associated with integration of product design and process technologies.

The following table outlines the major stress tests done during process and product introduction. Other tests may be required for particular product types.

Qualification Readpoint
Accelerated Stress Test Industry Standard Method General Notes Standard Life Long Life Automotive
High-Temperature Operating Life Test (HTOL) JESD22-A108 Acceleration factors are determined per JEP122; typically performed at 125°C 5–year equivalent use time 10–year equivalent use time 1008 Hours (125°C) or 406 Hours (150°C)
Electrostatic Discharge (ESD)
Human Body Model (HBM) ANSI/ESDA/JEDEC JS-001-2012 - +/-2000V (or Classification) +/-2000V or MM (or Classification) 1008 Hours (125°C) or 406 Hours (150°C)
Machine Model (MM) JESD22-A115 Typically characterized at various voltages Optional Test +/-200V (or Classification) +/-500V(or Classification) +/-750V corner pins, +/-500V other pins, (or Classification)
Charged Device Model (CDM) JESD22-C101 - +/-500V (or Classification) +/-500V (or Classification) +/-750V corner pins, +/-500V other pins, (or Classification)
Latch-up (LU) JESD78 Class I for Comm/lnd, Class II for Auto +/-100 mA (or Classification) +/-100 mA (or Classification) +/-100 mA
Preconditioning (PC) J-STD-020 For surface mount plastic packages only Performed prior to THB, HAST, T/C and AC
Temp and Humidity Bias (THB) JESD22-A101 For surface mount plastic packages only; PC is performed prior to this test; HAST is an alternate to THB 504 Hours (or Biased HAST) 1008 Hours (or Biased HAST) 1008 Hours (or Biased HAST)
Highly Accelerated Stress Testing (HAST) JESD22-A110 48 Hours at 130°C / 132 hours at 110°C (or THB) 96 Hours at 130°C / 264 hours at 110°C (or THB) 96 Hours at 130°C / 264 hours at 110°C (or THB)
Temperature Cycling (T/C) JESD22-A104 If PC is required, PC is performed prior to this test 200 Cycles (-65°C to 150°C) or equivalent cycles at other temperatures per JESD94 500 Cycles (-65°C to 150°C) or equivalent cycles at other temperatures per JESD94 500 Cycles (-65°C to 150°C) or 1000 Cycles (-50°C to 150°C)
Autoclave (AC) JESD22-A102 For surface mount plastic packages only; PC is performed prior to this test Optional Test 48 Hours Optional Test 96 Hours 96 Hours (or 96 Hours Unbiased HAST)
High Temperature Storage Life (HTSL) JESD22-A103 No bias Optional Test 504 Hours (150°C) or 240 Hours (175°C) Optional Test 1008 Hours (150°C) or 504 Hours (175°C) 1008 Hours (150°C) or 504 Hours (175°C)
Write/Erase Cycling JESD22-A117 Non-volatile
memory only
Performed prior to Data Retention Bake. Qualification readpoint determined per data sheet requirement
Data Retention Bake JESD22-A117 504 Hours (150°C) 1008 Hours (150°C) 1008 Hours (150°C)