MM912G634CV1AE

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MM912G634CV1AELast Revision (GMT):
Saturday, 19 December 2020, 10:39:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MM912G634CV1AESOT1571-1HLQFP48197.684648 mg YesYesYesNot ApplicableCu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 215 725572020-06-0993 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Tianjin, China
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuBonding Wire - AuGold and its compoundsGold, metal7440-57-50.79994899.9900000.404659
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000800.0100000.000041
Subtotal0.800028100.00000000.404699
Copper Lead-FrameCopper AlloyCopper and its compoundsCopper, metal7440-50-859.23562597.29100029.964707
Iron and its compoundsIron, metal7439-89-61.4429752.3700000.729938
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0103510.0170000.005236
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.1010690.1660000.051126
Tin and its compoundsTin, metal7440-31-50.0182660.0300000.009240
Zinc and its compoundsZinc, metal7440-66-60.0767150.1260000.038807
Subtotal60.885000100.000000030.799053
Silver PlatingMiscellaneous substancesProprietary Material-Other miscellaneous substances.0.0000620.0100000.000031
Silver and its compoundsSilver, metal7440-22-40.61493999.9900000.311070
Subtotal0.615000100.00000000.311101
Die EncapsulantDie EncapsulantEpoxy ResinsTetramethylbiphenyl diglycidyl ether85954-11-64.9106004.3000002.484057
Inorganic Silicon compoundsSilica, vitreous60676-86-0104.37880091.40000052.800661
Organic Phosphorus compoundsOther organic phosphorous compounds0.1941400.1700000.098207
Phenols and Phenolic Resins1,3,5-Triazine-2,4,6-triamine, polymer with formaldehyde and phenol25917-04-80.3083400.2700000.155976
Phenols and Phenolic ResinsPhenol p-xylylene dimethyl ether copolymer26834-02-64.4081203.8600002.229875
Subtotal114.200000100.000000057.768775
Epoxy AdhesiveEpoxy AdhesiveAcrylates2-propenoic acid, (1-methylethylidene)bis(4,1-phenyleneoxy-2,1-ethanediyl) ester24447-78-70.0700007.0000000.035410
AcrylatesDicyclopentenyloxyethyl acrylate65983-31-50.0450004.5000000.022763
Epoxy ResinsEpichlorohydrin, o-cresol, formaldehyde polymer29690-82-20.0200002.0000000.010117
Organic Silicon compounds3-(trimethoxysilyl)propyl methacrylate2530-85-00.0110001.1000000.005564
Organic compoundsOther Organic Peroxides0.0030000.3000000.001518
Polymers1,3-Butadiene, homopolymer, epoxidized, cyclized68441-49-60.0400004.0000000.020234
PolymersPoly(acrylonitrile-co-butadiene-co-acrylic acid), dicarboxy terminated68891-50-90.0110001.1000000.005564
Silver and its compoundsSilver, metal7440-22-40.80000080.0000000.404685
Subtotal1.000000100.00000000.505856
Semiconductor Die 1Semiconductor DieInorganic Silicon compoundsSilicon, doped9.89046498.0000005.003152
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2018462.0000000.102105
Subtotal10.092310100.00000005.105257
Semiconductor Die 2Semiconductor DieInorganic Silicon compoundsSilicon, doped9.89046498.0000005.003152
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2018462.0000000.102105
Subtotal10.092310100.00000005.105257
Total197.684648100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MM912G634CV1AE
Product content declaration of MM912G634CV1AE
上次修订 Last Revision (GMT):
Saturday, 19 December 2020, 10:39:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-金
Bonding Wire - Au
焊丝-金
Bonding Wire - Au
OOOOOO
铜引线框架
Copper Lead-Frame
铜合金
Copper Alloy
OOOOOO

镀银
Silver Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MM912G634CV1AELast Revision (GMT):
Saturday, 19 December 2020, 10:39:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
25 May 2020
Test Report
25 May 2020
Test Report
25 May 2020
Test Report
25 May 2020
Copper Lead-FrameAG SPOT PLATINGTest Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
20 Nov 2020
CDA 194Test Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
2 Dec 2019
Die EncapsulantTest Report
18 Dec 2019
Test Report
18 Dec 2019
Test Report
18 Dec 2019
Test Report
18 Jan 2019
Epoxy AdhesiveTest Report
27 Jul 2020
Test Report
27 Jul 2020
Test Report
27 Jul 2020
Test Report
27 Jul 2020
Post-plating - Lead FreeTest Report
16 Apr 2019
Test Report
16 Apr 2019
Test Report
16 Apr 2019
Test Report
16 Apr 2019
Semiconductor Die 1Test Report
26 Dec 2019
Test Report
26 Dec 2019
Test Report
26 Dec 2019
Test Report
26 Dec 2019
Semiconductor Die 2Test Report
10 Aug 2020
Test Report
10 Aug 2020
Test Report
10 Aug 2020
Test Report
10 Aug 2020
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.