MRF8S9102NR3

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MRF8S9102NR3Last Revision (GMT):
Monday, 09 May 2022, 11:10:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MRF8S9102NR3SOT1823-1FM2F2291.858074 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 144 175282020-08-2463 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AlBonding Wire - AlAluminum and its compoundsAluminum, metal7429-90-52.23971099.9900000.097725
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0002240.0100000.000010
Subtotal2.239934100.00000000.097734
Copper Lead-FrameCopper AlloyCopper and its compoundsCopper, metal7440-50-8491.41489597.29100021.441768
Iron and its compoundsIron, metal7439-89-611.9708232.3700000.522320
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0858670.0170000.003747
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.8384630.1660000.036584
Tin and its compoundsTin, metal7440-31-50.1515290.0300000.006612
Zinc and its compoundsZinc, metal7440-66-60.6364240.1260000.027769
Subtotal505.098000100.000000022.038799
Silver PlatingMiscellaneous substancesProprietary Material-Other miscellaneous substances.0.0005100.0100000.000022
Silver and its compoundsSilver, metal7440-22-45.10149099.9900000.222592
Subtotal5.102000100.00000000.222614
Header Assembly/FlangeHeader Assembly/FlangeCobalt and its compoundsCobalt, metal7440-48-45.7911410.3396000.252683
Copper and its compoundsCopper, metal7440-50-81680.00729598.51780073.303287
Gold and its compoundsGold, metal7440-57-51.4921230.0875000.065105
Nickel and its compoundsNickel, metal7440-02-013.6047480.7978000.593612
Palladium and its compoundsPalladium, metal7440-05-32.7216320.1596000.118752
Zirconium and its compoundsZirconium, metal7440-67-71.6660620.0977000.072695
Subtotal1705.283000100.000000074.406134
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0050000.0200000.000218
Tin and its compoundsTin, metal7440-31-524.99500099.9800001.090600
Subtotal25.000000100.00000001.090818
Semiconductor Die 1Semiconductor DieGold and its compoundsGold, metal7440-57-50.1652401.0200000.007210
Inorganic Silicon compoundsSilicon, doped15.71406597.0004000.685647
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3206951.9796000.013993
Subtotal16.200000100.00000000.706850
Semiconductor Die 2Semiconductor DieGold and its compoundsGold, metal7440-57-50.1652401.0200000.007210
Inorganic Silicon compoundsSilicon, doped15.71406597.0004000.685647
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3206951.9796000.013993
Subtotal16.200000100.00000000.706850
Semiconductor Die 3Semiconductor DieInorganic Silicon compoundsSilicon7440-21-316.40043798.0000000.715596
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3347032.0000000.014604
Subtotal16.735140100.00000000.730200
Total2291.858074100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MRF8S9102NR3
Product content declaration of MRF8S9102NR3
上次修订 Last Revision (GMT):
Monday, 09 May 2022, 11:10:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铝
Bonding Wire - Al
焊丝-铝
Bonding Wire - Al
OOOOOO
铜引线框架
Copper Lead-Frame
铜合金
Copper Alloy
OOOOOO

镀银
Silver Plating
OOOOOO
封装焊头/法兰
Header Assembly/Flange
封装焊头/法兰
Header Assembly/Flange
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 3
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MRF8S9102NR3Last Revision (GMT):
Monday, 09 May 2022, 11:10:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AlTest Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
20 Nov 2020
Test Report
20 Nov 2020
Copper Lead-FrameCDA 194Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
CDA 194 + NI PLATINGTest Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Header Assembly/FlangeC151Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
C151 + CU_NICO_AU PLATINGTest Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Test Report
27 Aug 2021
Post-plating - Lead FreeTest Report
23 Jul 2021
Test Report
23 Jul 2021
Test Report
23 Jul 2021
Test Report
23 Jul 2021
Semiconductor Die 1Test Report
19 Aug 2021
Test Report
19 Aug 2021
Test Report
19 Aug 2021
Test Report
19 Aug 2021
Semiconductor Die 2Test Report
19 Aug 2021
Test Report
19 Aug 2021
Test Report
19 Aug 2021
Test Report
19 Aug 2021
Semiconductor Die 3Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.