NXP Semiconductors Compliance Documentation of AFRX5G372T4 | Last Revision (GMT): Tuesday, 27 February 2024, 01:22:00 AM | ||||||
Subpart | Homogeneous Material | Certificate of Analysis(CoA) | |||
---|---|---|---|---|---|
RoHS | Phthalates * | Halogens * | Antimony * | ||
Bonding Wire - Au | Test Report 13 Jul 2023 | Test Report 13 Jul 2023 | Test Report 13 Jul 2023 | Test Report 13 Jul 2023 | |
Capacitor 1 | CERAMIC | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 |
INNER ELECTRODE | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
OUTER ELECTRODE | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
Capacitor 2 | CERAMIC | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 |
INNER ELECTRODE | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
OUTER ELECTRODE | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
Capacitor 3 | CERAMIC | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
INNER ELECTRODE | Test Report 6 Oct 2022 | Test Report 6 Oct 2022 | Test Report 6 Oct 2022 | Test Report 6 Oct 2022 | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
OUTER ELECTRODE | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
Capacitor 4 | CERAMIC | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 | Test Report 12 Dec 2022 |
INNER ELECTRODE | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | Test Report 29 Sep 2023 | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
OUTER ELECTRODE | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | Test Report 21 Sep 2023 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
Die Encapsulant | Test Report 17 Feb 2023 | Test Report 17 Feb 2023 | Test Report 17 Feb 2023 | Test Report 17 Feb 2023 | |
Epoxy Adhesive | Test Report 14 Apr 2023 | Test Report 14 Apr 2023 | Test Report 14 Apr 2023 | Test Report 14 Apr 2023 | |
Inductor 1 | ELECTRODE | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
GLAZE BB | Not Available | Not Available | Test Report 28 Oct 2020 | Test Report 28 Oct 2020 | |
GLAZE BC | Not Available | Not Available | Test Report 27 Nov 2020 | Test Report 27 Nov 2020 | |
INNER GLAZE | Test Report 14 Sep 2022 | Test Report 14 Sep 2022 | Not Available | Not Available | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 25 Jun 2021 | |
OUTER GLAZE | Test Report 1 Nov 2022 | Test Report 1 Nov 2022 | Not Available | Not Available | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 4 Jun 2021 | |
Inductor 2 | ELECTRODE | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
GLAZE BB | Not Available | Not Available | Test Report 28 Oct 2020 | Test Report 28 Oct 2020 | |
GLAZE BC | Not Available | Not Available | Test Report 27 Nov 2020 | Test Report 27 Nov 2020 | |
INNER GLAZE | Test Report 14 Sep 2022 | Test Report 14 Sep 2022 | Not Available | Not Available | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 25 Jun 2021 | |
OUTER GLAZE | Test Report 1 Nov 2022 | Test Report 1 Nov 2022 | Not Available | Not Available | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 4 Jun 2021 | |
Inductor 3 | ELECTRODE | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
GLAZE BB | Not Available | Not Available | Test Report 28 Oct 2020 | Test Report 28 Oct 2020 | |
GLAZE BC | Not Available | Not Available | Test Report 27 Nov 2020 | Test Report 27 Nov 2020 | |
INNER GLAZE | Test Report 14 Sep 2022 | Test Report 14 Sep 2022 | Not Available | Not Available | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 25 Jun 2021 | |
OUTER GLAZE | Test Report 1 Nov 2022 | Test Report 1 Nov 2022 | Not Available | Not Available | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 4 Jun 2021 | |
Inductor 4 | ELECTRODE | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
INNER GLAZE | Test Report 14 Sep 2022 | Test Report 14 Sep 2022 | Test Report 24 Sep 2021 | Test Report 24 Sep 2021 | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
OUTER GLAZE | Test Report 1 Nov 2022 | Test Report 1 Nov 2022 | Test Report 15 Nov 2021 | Test Report 15 Nov 2021 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 20 May 2022 | |
Inductor 5 | ELECTRODE | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 | Test Report 14 Jun 2022 |
GLAZE BB | Not Available | Not Available | Test Report 28 Oct 2020 | Test Report 28 Oct 2020 | |
GLAZE BC | Test Report 15 Nov 2021 | Test Report 15 Nov 2021 | Test Report 27 Nov 2020 | Test Report 27 Nov 2020 | |
INNER GLAZE | Test Report 14 Sep 2022 | Test Report 14 Sep 2022 | Not Available | Not Available | |
NI PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 25 Jun 2021 | |
SN PLATING | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 27 Apr 2023 | Test Report 4 Jun 2021 | |
Resistor 1 | ALUMINA | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 |
BOTTOM CONDUCTOR | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
INSULATION 1ST OVERCOAT | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
INSULATION 2ND OVERCOAT | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
NI PLATING | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
RESISTIVE LAYER | Test Report 6 Nov 2019 | Test Report 6 Nov 2019 | Test Report 6 Nov 2019 | Test Report 6 Nov 2019 | |
SN PLATING | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
TERMINAL CONDUCTOR | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
TOP CONDUCTOR | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | Test Report 30 Oct 2023 | |
Resistor 2 | EXTERNAL ELECTRODE | Test Report 1 Jun 2020 | Test Report 1 Jun 2020 | Test Report 1 Jun 2020 | Test Report 1 Jun 2020 |
INTERNAL ELECTRODE | Test Report 27 Dec 2019 | Test Report 27 Dec 2019 | Test Report 27 Dec 2019 | Test Report 27 Dec 2019 | |
OVERCOAT | Test Report 27 Aug 2020 | Test Report 27 Aug 2020 | Not Available | Not Available | |
OVERGLAZE | Test Report 12 Nov 2020 | Test Report 12 Nov 2020 | Test Report 12 Nov 2020 | Test Report 12 Nov 2020 | |
RESISTIVE ELECTRODE | Test Report 19 Oct 2020 | Test Report 19 Oct 2020 | Not Available | Not Available | |
SECONDARY ELECTRODE | Test Report 1 Sep 2020 | Test Report 1 Sep 2020 | Test Report 1 Sep 2020 | Test Report 1 Sep 2020 | |
SUSBTRATE | Test Report 13 Feb 2020 | Test Report 13 Feb 2020 | Not Available | Test Report 13 Feb 2020 | |
Semiconductor Die 1 | Test Report 2 May 2023 | Test Report 2 May 2023 | Test Report 2 May 2023 | Test Report 2 May 2023 | |
Semiconductor Die 2 | Test Report 2 May 2023 | Test Report 2 May 2023 | Test Report 2 May 2023 | Test Report 2 May 2023 | |
Semiconductor Die 3 | Test Report 23 Jun 2021 | Test Report 23 Jun 2021 | Test Report 23 Jun 2021 | Test Report 23 Jun 2021 | |
Solder Flux | Test Report 6 Nov 2019 | Test Report 6 Nov 2019 | Not Available | Not Available | |
Solder Paste | Test Report 14 Oct 2022 | Test Report 14 Oct 2022 | Test Report 15 Feb 2020 | Test Report 14 Oct 2022 | |
Substrate, Pre-plated NiPdAu | Not Available | Not Available | Not Available | Not Available |
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Note(s): | |||||
* NXP does not commit to providing this report for all product materials! |
Disclaimer | |||||
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |