NXP Semiconductors Compliance Documentation of MC34PF1510A1EPR2 | Last Revision (GMT): Tuesday, 28 November 2023, 10:21:00 PM | ||||||
Subpart | Homogeneous Material | Certificate of Analysis(CoA) | |||
---|---|---|---|---|---|
RoHS | Phthalates * | Halogens * | Antimony * | ||
Bonding Wire - CuPd | Test Report 15 Sep 2023 | Test Report 15 Sep 2023 | Test Report 15 Sep 2023 | Test Report 15 Sep 2023 | |
Copper Lead-Frame, Pre-Plated NiPdAu | Not Available | Not Available | Not Available | Not Available | |
Die Encapsulant | Test Report 13 Nov 2023 | Test Report 13 Nov 2023 | Test Report 13 Nov 2023 | Test Report 13 Nov 2023 | |
Epoxy Adhesive | Test Report 22 Nov 2023 | Test Report 22 Nov 2023 | Test Report 22 Nov 2023 | Not Available | |
Semiconductor Die | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 |
For More Information : | contact us |
Note(s): | |||||
* NXP does not commit to providing this report for all product materials! |
Disclaimer | |||||
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |