A3I25X050GNR1

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of A3I25X050GNR1Last Revision (GMT):
Tuesday, 13 April 2021, 11:50:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
A3I25X050GNR1SOT2000FM81609.570000 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 955 055642019-12-0323 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AlBonding Wire - AlAluminum and its compoundsAluminum, metal7429-90-50.88991199.9900000.055289
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000890.0100000.000005
Subtotal0.890000100.00000000.055294
Copper Lead-Frame, Pre-Plated NiCopper Lead-Frame, Pre-Plated NiCopper and its compoundsCopper, metal7440-50-81082.72409699.72590067.267910
Iron and its compoundsIron, metal7439-89-61.2040410.1109000.074805
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0108570.0010000.000674
Nickel and its compoundsNickel, metal7440-02-01.6394070.1510000.101854
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.0423420.0039000.002631
Tin and its compoundsTin, metal7440-31-50.0152000.0014000.000944
Zinc and its compoundsZinc, metal7440-66-60.0640560.0059000.003980
Subtotal1085.700000100.000000067.452798
Die EncapsulantDie EncapsulantAnhydridesBenzophenonetetracarboxylic Acid Dianhydride2421-28-537.3815817.4838002.322458
Epoxy ResinsEpichlorohydrin, o-cresol, formaldehyde polymer29690-82-214.9525332.9935000.928977
Epoxy ResinsOther Epoxy resins14.9525332.9935000.928977
Epoxy ResinsProprietary Material-Other Epoxy resins14.9525332.9935000.928977
Inorganic Silicon compoundsQuartz14808-60-714.9525332.9935000.928977
Inorganic Silicon compoundsSilica, vitreous60676-86-0398.73886279.82760024.773005
Magnesium and its compoundsMagnesium, metal7439-95-40.8916070.1785000.055394
Organic Silicon compoundsProprietary Material-Other organic silicon compounds2.6778200.5361000.166369
Subtotal499.500000100.000000031.033133
Epoxy AdhesiveEpoxy AdhesiveEpoxy ResinsProprietary Material-Other Epoxy resins0.3177533.0612000.019741
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.3177533.0612000.019741
Silver and its compoundsSilver, metal7440-22-49.74449593.8776000.605410
Subtotal10.380000100.00000000.644893
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0014200.0200000.000088
Tin and its compoundsTin, metal7440-31-57.09858099.9800000.441023
Subtotal7.100000100.00000000.441112
Semiconductor DieSemiconductor DieGold and its compoundsGold, metal7440-57-50.0612001.0200000.003802
Inorganic Silicon compoundsSilicon, doped5.82002497.0004000.361589
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1187761.9796000.007379
Subtotal6.000000100.00000000.372770
Total1609.570000100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 A3I25X050GNR1
Product content declaration of A3I25X050GNR1
上次修订 Last Revision (GMT):
Tuesday, 13 April 2021, 11:50:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铝
Bonding Wire - Al
焊丝-铝
Bonding Wire - Al
OOOOOO
铜引线框架,预镀镍
Copper Lead-Frame, Pre-Plated Ni
铜引线框架,预镀镍
Copper Lead-Frame, Pre-Plated Ni
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of A3I25X050GNR1Last Revision (GMT):
Tuesday, 13 April 2021, 11:50:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AlTest Report
16 Oct 2020
Test Report
16 Oct 2020
Test Report
16 Oct 2020
Test Report
16 Oct 2020
Copper Lead-Frame, Pre-Plated NiTest Report
13 Nov 2019
Test Report
13 Nov 2019
Test Report
13 Nov 2019
Test Report
8 Apr 2020
Die EncapsulantTest Report
12 Jun 2019
Test Report
12 Jun 2019
Test Report
12 Jun 2019
Test Report
12 Jun 2019
Epoxy AdhesiveTest Report
29 Jul 2019
Test Report
29 Jul 2019
Test Report
29 Jul 2019
Test Report
29 Jul 2019
Post-plating - Lead FreeTest Report
16 Apr 2019
Test Report
16 Apr 2019
Test Report
16 Apr 2019
Test Report
16 Apr 2019
Semiconductor DieTest Report
3 Aug 2020
Test Report
3 Aug 2020
Test Report
3 Aug 2020
Test Report
3 Aug 2020
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.