A5G26H605W19NR3

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of A5G26H605W19NR3Last Revision (GMT):
Friday, 23 January 2026, 03:59:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
A5G26H605W19NR3SOT2082FM8F3632.415712 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9354 611 335282025-12-12H3 / 168 hours24530 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia;External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuWireGold and its compoundsGold, metal7440-57-514.94457799.9900000.411423
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0014950.0100000.000041
Subtotal14.946072100.00000000.411464
Copper Lead-Frame, Pre-Plated AgCopper AlloyCopper and its compoundsCopper, metal7440-50-8280.69981097.2910007.727634
Iron and its compoundsIron, metal7439-89-66.8378222.3700000.188245
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0490480.0170000.001350
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.4789360.1660000.013185
Tin and its compoundsTin, metal7440-31-50.0865550.0300000.002383
Zinc and its compoundsZinc, metal7440-66-60.3635300.1260000.010008
Subtotal288.515700100.00000007.942805
Silver PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0002910.0100000.000008
Silver and its compoundsSilver, metal7440-22-42.91400999.9900000.080222
Subtotal2.914300100.00000000.080230
Die EncapsulantDie EncapsulantEpoxy ResinsEpichlorohydrin, o-cresol, formaldehyde polymer29690-82-235.9076003.0000000.988532
Epoxy ResinsProprietary Material-Other Epoxy resins35.9076003.0000000.988532
Inorganic Silicon compoundsSilica, vitreous60676-86-01047.30500087.50000028.832190
Inorganic Silicon compoundsSilicon dioxide7631-86-935.9076003.0000000.988532
Inorganic compoundsCarbon Black1333-86-45.9846000.5000000.164755
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins35.9076003.0000000.988532
Subtotal1196.920000100.000000032.951074
Epoxy AdhesiveEpoxy AdhesiveEpoxy ResinsProprietary Material-Other Epoxy resins0.2511413.0612000.006914
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.2511413.0612000.006914
Silver and its compoundsSilver, metal7440-22-47.70171893.8776000.212027
Subtotal8.204000100.00000000.225855
Header Assembly/FlangeFlangeCopper and its compoundsCopper, metal7440-50-81727.09588585.64000047.546757
Molybdenum and its compoundsMolybdenum, metal7439-98-7289.59711514.3600007.972576
Subtotal2016.693000100.000000055.519334
Silver PlatingMiscellaneous substancesProprietary Material-Other miscellaneous substances.0.0008070.1000000.000022
Silver and its compoundsSilver, metal7440-22-40.80619399.9000000.022194
Subtotal0.807000100.00000000.022217
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0194660.0200000.000536
Tin and its compoundsTin, metal7440-31-597.30853499.9800002.678893
Subtotal97.328000100.00000002.679429
Semiconductor Die 1Die SubstrateInorganic Silicon compoundsSilicon carbide409-21-20.62387495.2000000.017175
Inorganic compoundsGallium nitride25617-97-40.0242473.7000000.000668
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0072091.1000000.000199
Subtotal0.655330100.00000000.018041
Semiconductor Die 2Semiconductor DieGold and its compoundsGold, metal7440-57-50.0077221.0200000.000213
Inorganic Silicon compoundsSilicon7440-21-30.73434197.0004000.020216
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0149871.9796000.000413
Subtotal0.757050100.00000000.020841
Semiconductor Die 3Semiconductor DieGold and its compoundsGold, metal7440-57-50.0068131.0200000.000188
Inorganic Silicon compoundsSilicon7440-21-30.64786697.0004000.017836
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0132221.9796000.000364
Subtotal0.667900100.00000000.018387
Semiconductor Die 4Semiconductor DieGold and its compoundsGold, metal7440-57-50.0068131.0200000.000188
Inorganic Silicon compoundsSilicon7440-21-30.64786697.0004000.017836
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0132221.9796000.000364
Subtotal0.667900100.00000000.018387
Semiconductor Die 5Semiconductor DieGold and its compoundsGold, metal7440-57-50.0065301.0200000.000180
Inorganic Silicon compoundsSilicon7440-21-30.62095897.0004000.017095
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0126731.9796000.000349
Subtotal0.640160100.00000000.017624
Semiconductor Die 6Die SubstrateInorganic Silicon compoundsSilicon carbide409-21-22.56973495.2000000.070745
Inorganic compoundsGallium nitride25617-97-40.0998743.7000000.002750
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0296921.1000000.000817
Subtotal2.699300100.00000000.074311
Total3632.415712100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 A5G26H605W19NR3
Product content declaration of A5G26H605W19NR3
上次修订 Last Revision (GMT):
Friday, 23 January 2026, 03:59:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
焊丝-金
Bonding Wire - Au
线
Wire
OOOOOOOOOO
铜引线框架,预镀银
Copper Lead-Frame, Pre-Plated Ag
铜合金
Copper Alloy
OOOOOOOOOO

镀银
Silver Plating
OOOOOOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOOOOOO
封装焊头/法兰
Header Assembly/Flange
法兰盘
Flange
OOOOOOOOOO

镀银
Silver Plating
OOOOOOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOOOOOO
半导体芯片
Semiconductor Die 1
模具基板
Die Substrate
OOOOOOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOOOOOO
半导体芯片
Semiconductor Die 3
半导体芯片
Semiconductor Die
OOOOOOOOOO
半导体芯片
Semiconductor Die 4
半导体芯片
Semiconductor Die
OOOOOOOOOO
半导体芯片
Semiconductor Die 5
半导体芯片
Semiconductor Die
OOOOOOOOOO
半导体芯片
Semiconductor Die 6
模具基板
Die Substrate
OOOOOOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of A5G26H605W19NR3Last Revision (GMT):
Friday, 23 January 2026, 03:59:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
24 Mar 2025
Test Report
24 Mar 2025
Test Report
24 Mar 2025
Test Report
24 Mar 2025
Copper Lead-Frame, Pre-Plated AgCDA 194Test Report
3 Dec 2025
Test Report
3 Dec 2025
Test Report
3 Dec 2025
Not Available
Die EncapsulantTest Report
3 Apr 2025
Test Report
3 Apr 2025
Test Report
3 Apr 2025
Test Report
3 Apr 2025
Epoxy AdhesiveTest Report
25 Jul 2025
Test Report
25 Jul 2025
Test Report
25 Jul 2025
Test Report
25 Jul 2025
Header Assembly/FlangeTest Report
26 Sep 2025
Test Report
26 Sep 2025
Test Report
26 Sep 2025
Test Report
26 Sep 2025
Post-plating - Lead FreeTest Report
21 May 2025
Test Report
21 May 2025
Test Report
21 May 2025
Test Report
21 May 2025
Semiconductor Die 1Test Report
5 Jun 2025
Test Report
5 Jun 2025
Test Report
5 Jun 2025
Test Report
5 Jun 2025
Semiconductor Die 2AU BUMPINGNot AvailableNot AvailableNot AvailableNot Available
DIENot AvailableNot AvailableNot AvailableNot Available
Semiconductor Die 3AU BUMPINGNot AvailableNot AvailableNot AvailableNot Available
DIENot AvailableNot AvailableNot AvailableNot Available
Semiconductor Die 4AU BUMPINGNot AvailableNot AvailableNot AvailableNot Available
DIENot AvailableNot AvailableNot AvailableNot Available
Semiconductor Die 5AU BUMPINGNot AvailableNot AvailableNot AvailableNot Available
DIENot AvailableNot AvailableNot AvailableNot Available
Semiconductor Die 6Not AvailableNot AvailableNot AvailableNot Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.