LPC4367JBD208E

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of LPC4367JBD208ELast Revision (GMT):
Friday, 02 September 2022, 05:53:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
LPC4367JBD208ESOT459-1LQFP2081970.231310 mg YesYesYesTin (Sn)Not Applicablee3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 061 325512021-09-273 / 168 hours26030 sec.3 / 168 hours24020 sec.3Kaohsiung, Taiwan
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuBonding Wire - AuCalcium and its compoundsCalcium7440-70-20.0001160.0020000.000006
Gold and its compoundsGold, metal7440-57-55.72876698.8400000.290766
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.0004640.0080000.000023
Palladium and its compoundsPalladium, metal7440-05-30.0666541.1500000.003383
Subtotal5.796000100.00000000.294179
Die EncapsulantDie EncapsulantEpoxy ResinsOther Epoxy resins29.8584001.5600001.515477
Epoxy ResinsTetramethylbiphenyl diglycidyl ether85954-11-669.6696003.6400003.536113
Inorganic Silicon compoundsSilica, vitreous60676-86-01504.59540078.61000076.366434
Inorganic Silicon compoundsSilicon dioxide7631-86-9167.2836008.7400008.490556
Inorganic compoundsCarbon Black1333-86-43.2538000.1700000.165148
Miscellaneous substancesOther miscellaneous substances (less than 10%).59.5254003.1100003.021239
Phenols and Phenolic ResinsOther phenolic resins5.9334000.3100000.301152
Phenols and Phenolic ResinsPhenol p-xylylene dimethyl ether copolymer26834-02-673.8804003.8600003.749834
Subtotal1914.000000100.000000097.145954
Epoxy AdhesiveEpoxy AdhesiveAcrylatesProprietary Material-Other Methacrylate compounds0.1158293.3094000.005879
AcrylatesProprietary Material-Other acrylates0.3088828.8252000.015677
Organic compounds1,1'-(methylenedi-p-phenylene)bismaleimide13676-54-50.1158293.3094000.005879
Palladium and its compoundsPalladium, metal7440-05-30.0057920.1655000.000294
PolymersProprietary Material-Other polymers0.0579151.6547000.002939
Silver and its compoundsSilver, metal7440-22-42.89575382.7358000.146975
Subtotal3.500000100.00000000.177644
Post-plating - Lead FreePost-plating - Lead FreeAntimony and its compoundsAntimony, metal7440-36-00.0005700.0030000.000029
Bismuth and its compoundsBismuth, metal7440-69-90.0001900.0010000.000010
Copper and its compoundsCopper, metal7440-50-80.0001900.0010000.000010
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0009500.0050000.000048
Tin and its compoundsTin, metal7440-31-518.99810099.9900000.964257
Subtotal19.000000100.00000000.964354
Pre-plating - Precious metal - AgPre-plating - Precious metal - AgMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000500.0100000.000003
Silver and its compoundsSilver, metal7440-22-40.49995099.9900000.025375
Subtotal0.500000100.00000000.025378
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-326.88660498.0000001.364642
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.5487062.0000000.027850
Subtotal27.435310100.00000001.392492
Total1970.231310100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 LPC4367JBD208E
Product content declaration of LPC4367JBD208E
上次修订 Last Revision (GMT):
Friday, 02 September 2022, 05:53:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-金
Bonding Wire - Au
焊丝-金
Bonding Wire - Au
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
预镀 - 贵金属 - 银
Pre-plating - Precious metal - Ag
预镀 - 贵金属 - 银
Pre-plating - Precious metal - Ag
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of LPC4367JBD208ELast Revision (GMT):
Friday, 02 September 2022, 05:53:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
22 Jul 2022
Test Report
22 Jul 2022
Test Report
22 Jul 2022
Test Report
22 Jul 2022
Die EncapsulantTest Report
10 Dec 2021
Test Report
10 Dec 2021
Test Report
10 Dec 2021
Test Report
24 Dec 2019
Epoxy AdhesiveTest Report
11 Jan 2022
Test Report
11 Jan 2022
Test Report
11 Jan 2022
Test Report
11 Jan 2022
Post-plating - Lead FreeTest Report
3 Jun 2022
Test Report
3 Jun 2022
Test Report
3 Jun 2022
Test Report
3 Jun 2022
Pre-plating - Precious metal - AgNot AvailableNot AvailableNot AvailableNot Available
Semiconductor DieTest Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.