MC33882PVWR2

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

Download

NXP Semiconductors
Product content declaration of MC33882PVWR2Last Revision (GMT):
Tuesday, 24 September 2024, 10:44:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MC33882PVWR2SOT1577-1HSOP301908.199901 mg NoNoYesOtherCu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 173 445182024-06-078Not ApplicableNot ApplicableNot Applicable3 / 168 hours24530 sec.3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuBonding Wire - CuCopper and its compoundsCopper, metal7440-50-82.13390497.0000000.111828
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0659973.0000000.003459
Subtotal2.199901100.00000000.115287
Copper Lead-Frame, Pre-PlatedCopper AlloyCopper and its compoundsCopper, metal7440-50-81098.00401097.52000057.541351
Iron and its compoundsIron, metal7439-89-625.8963212.3000001.357107
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.3377780.0300000.017701
Zinc and its compoundsZinc, metal7440-66-61.6888910.1500000.088507
Subtotal1125.927000100.000000059.004667
Gold PlatingGold and its compoundsGold, metal7440-57-50.11371999.9900000.005960
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000110.0100000.000001
Subtotal0.113730100.00000000.005960
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0010800.0100000.000057
Nickel and its compoundsNickel, metal7440-02-010.80327099.9900000.566150
Subtotal10.804350100.00000000.566206
Palladium PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000460.0100000.000002
Palladium and its compoundsPalladium, metal7440-05-30.45487599.9900000.023838
Subtotal0.454920100.00000000.023840
Die EncapsulantDie EncapsulantAntimony OxidesAntimony(III) oxide1309-64-48.9196001.2000000.467435
Epoxy ResinsTetramethylbiphenyl diglycidyl ether85954-11-611.8928001.6000000.623247
Inorganic Silicon compoundsSilica, vitreous60676-86-0616.93900083.00000032.330942
Inorganic Silicon compoundsSilicon dioxide7631-86-922.2990003.0000001.168588
Inorganic compoundsCarbon Black1333-86-43.7165000.5000000.194765
Phenols - Specific3,5,3',5'-Tetrabromobisphenol A, epichlorohydrin polymer40039-93-85.9464000.8000000.311623
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins25.2722003.4000001.324400
PolymersPlastic: EP - Epoxide, Epoxy48.3145006.5000002.531941
Subtotal743.300000100.000000038.952942
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon, doped11.27000098.0000000.590609
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2300002.0000000.012053
Subtotal11.500000100.00000000.602662
Solder WireSolder WireLead and its compoundsLead, metallic lead and lead alloys7439-92-113.27450095.5000000.695656
Silver and its compoundsSilver, metal7440-22-40.3475002.5000000.018211
Tin and its compoundsTin, metal7440-31-50.2780002.0000000.014569
Subtotal13.900000100.00000000.728435
Total1908.199901100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MC33882PVWR2
Product content declaration of MC33882PVWR2
上次修订 Last Revision (GMT):
Tuesday, 24 September 2024, 10:44:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铜
Bonding Wire - Cu
焊丝-铜
Bonding Wire - Cu
OOOOOO
铜引线框架,预镀
Copper Lead-Frame, Pre-Plated
铜合金
Copper Alloy
OOOOOO

镀金材料
Gold Plating
OOOOOO

镀镍层
Nickel Plating
OOOOOO

钯镀层
Palladium Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
焊丝
Solder Wire
焊丝
Solder Wire
XOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品的环保使用期限(EFUP)为50年。
Remark: This semiconductor product has an environmental friendly use period (EFUP) of 50 years.
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MC33882PVWR2Last Revision (GMT):
Tuesday, 24 September 2024, 10:44:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuNot AvailableNot AvailableNot AvailableNot Available
Copper Lead-Frame, Pre-PlatedAU PLATINGTest Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
CDA 194Test Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
NI PLATINGTest Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
PD PLATINGTest Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
Test Report
3 Nov 2022
Die EncapsulantTest Report
20 Dec 2023
Test Report
20 Dec 2023
Test Report
20 Dec 2023
Test Report
20 Dec 2023
Semiconductor DieTest Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
Solder WireTest Report
12 Oct 2023
Test Report
12 Oct 2023
Test Report
12 Oct 2023
Test Report
12 Oct 2023
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.