MC33FS8510A3ES

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

Download

NXP Semiconductors
Product content declaration of MC33FS8510A3ESLast Revision (GMT):
Monday, 26 July 2021, 09:40:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MC33FS8510A3ESSOT684HVQFN56188.130000 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 804 055572020-11-14113 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuPdAuBonding Wire - CuPdAuCopper and its compoundsCopper, metal7440-50-81.81500696.5429000.964762
Gold and its compoundsGold, metal7440-57-50.0065930.3507000.003505
Palladium and its compoundsPalladium, metal7440-05-30.0584003.1064000.031043
Subtotal1.880000100.00000000.999309
Copper Lead-Frame, Pre-Plated AgCopper Lead-Frame, Pre-Plated AgCopper and its compoundsCopper, metal7440-50-892.54189594.05620049.190398
Inorganic Silicon compoundsSilicon7440-21-30.7133280.7250000.379167
Iron and its compoundsIron, metal7439-89-60.1229870.1250000.065374
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0307960.0313000.016370
Magnesium and its compoundsMagnesium, metal7439-95-40.1721820.1750000.091523
Manganese and its compoundsManganese, metal7439-96-50.0614940.0625000.032687
Nickel and its compoundsNickel, metal7440-02-03.1484803.2000001.673566
Silver and its compoundsSilver, metal7440-22-40.9839001.0000000.522989
Zinc and its compoundsZinc, metal7440-66-60.6149380.6250000.326868
Subtotal98.390000100.000000052.298942
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins2.0800002.5000001.105619
Inorganic Silicon compoundsSilica, vitreous60676-86-066.56000080.00000035.379791
Inorganic Silicon compoundsSilicon dioxide7631-86-97.9040009.5000004.201350
Inorganic compoundsCarbon Black1333-86-40.4160000.5000000.221124
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins6.2400007.5000003.316855
Subtotal83.200000100.000000044.224738
Epoxy AdhesiveEpoxy AdhesiveMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0737109.1000000.039180
PolymersOther acrylic resins0.0688508.5000000.036597
PolymersPlastic: EP - Epoxide, Epoxy0.0105301.3000000.005597
PolymersPlastic: PBR - Polybutadiene Rubber0.0388804.8000000.020667
Silver and its compoundsSilver, metal7440-22-40.61803076.3000000.328512
Subtotal0.810000100.00000000.430553
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0002000.0200000.000106
Tin and its compoundsTin, metal7440-31-50.99980099.9800000.531441
Subtotal1.000000100.00000000.531547
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon, doped2.79300098.0000001.484612
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0570002.0000000.030298
Subtotal2.850000100.00000001.514910
Total188.130000100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MC33FS8510A3ES
Product content declaration of MC33FS8510A3ES
上次修订 Last Revision (GMT):
Monday, 26 July 2021, 09:40:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
键合线-铜钯金
Bonding Wire - CuPdAu
键合线-铜钯金
Bonding Wire - CuPdAu
OOOOOO
铜引线框架,预镀银
Copper Lead-Frame, Pre-Plated Ag
铜引线框架,预镀银
Copper Lead-Frame, Pre-Plated Ag
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MC33FS8510A3ESLast Revision (GMT):
Monday, 26 July 2021, 09:40:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuPdAuTest Report
2 Feb 2021
Test Report
2 Feb 2021
Test Report
2 Feb 2021
Test Report
2 Feb 2021
Copper Lead-Frame, Pre-Plated AgTest Report
2 Dec 2019
Test Report
2 Dec 2019
Test Report
2 Dec 2019
Test Report
2 Dec 2019
Die EncapsulantTest Report
16 Sep 2020
Test Report
16 Sep 2020
Test Report
16 Sep 2020
Test Report
16 Sep 2020
Epoxy AdhesiveTest Report
27 Jul 2020
Test Report
27 Jul 2020
Test Report
27 Jul 2020
Test Report
27 Jul 2020
Post-plating - Lead FreeTest Report
3 Sep 2020
Test Report
3 Sep 2020
Test Report
16 Dec 2019
Test Report
18 Dec 2019
Semiconductor DieTest Report
4 Aug 2020
Test Report
4 Aug 2020
Test Report
4 Aug 2020
Test Report
4 Aug 2020
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.