MCIMX6Q5EYM12AE

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MCIMX6Q5EYM12AELast Revision (GMT):
Thursday, 21 March 2024, 07:40:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MCIMX6Q5EYM12AESOT1642LFBGA6241269.425000 mg YesYesYesTin/Silver/Copper (Sn/Ag/Cu)Othere1contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 578 735572023-11-24123 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia;External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon, doped33.95840089.6000002.675101
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3411000.9000000.026870
Nickel and its compoundsNickel, metal7440-02-00.1895000.5000000.014928
Silver and its compoundsSilver, metal7440-22-40.1193850.3150000.009405
Tin and its compoundsTin, metal7440-31-53.2916158.6850000.259300
Subtotal37.900000100.00000002.985604
Solder Ball - SAC, Lead FreeSolder Ball - SAC, Lead FreeCopper and its compoundsCopper, metal7440-50-81.8157500.6000000.143037
Silver and its compoundsSilver, metal7440-22-49.0787503.0000000.715186
Tin and its compoundsTin, metal7440-31-5291.73050096.40000022.981310
Subtotal302.625000100.000000023.839534
SubstrateSubstrateAluminum and its compoundsAluminum Hydroxide21645-51-2143.22619815.62070011.282762
Arsenic and its compoundsArsenic, metal7440-38-20.0091690.0010000.000722
Barium and its compoundsBarium sulfate7727-43-73.7666250.4108000.296719
Copper and its compoundsCopper phthalocyanine147-14-80.6024030.0657000.047455
Copper and its compoundsCopper, metal7440-50-8315.54471734.41430024.857295
Epoxy ResinsBisphenol A diglycidyl ether1675-54-37.0619640.7702000.556312
Epoxy ResinsOther Epoxy resins14.2367061.5527001.121508
Epoxy ResinsProprietary Material-Other Epoxy resins38.1943864.1656003.008794
Inorganic Silicon compoundsFibrous-glass-wool65997-17-3276.90013230.19960021.813036
Inorganic Silicon compoundsSilicon dioxide7631-86-968.6391347.4860005.407104
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0091690.0010000.000722
Phenols and Phenolic ResinsPhenol, 4,4'-(1-methylethylidene)bis-, polymer with (chloromethyl)oxirane25068-38-613.2565401.4458001.044295
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins25.6832862.8011002.023222
Silver and its compoundsSilver, metal7440-22-40.2943250.0321000.023186
Tin and its compoundsTin, metal7440-31-59.4752451.0334000.746420
Subtotal916.900000100.000000072.229553
UnderfillUnderfillAromatic amines and their salts4,4'-Methylenebis(2-ethylbenzenamine)19900-65-31.32000011.0000000.103984
Bismuth and its compoundsBismuth nitrate10361-44-10.0120000.1000000.000945
Bismuth and its compoundsBismuth trioxide1304-76-30.0960000.8000000.007562
Epoxy Resins1,6-Bis(2,3-epoxypropoxy) naphthalene27610-48-61.68000014.0000000.132343
Epoxy ResinsOther Epoxy resins0.4800004.0000000.037812
Epoxy ResinsPhenolic Polymer Resin, Epikote 1559003-36-51.20000010.0000000.094531
Inorganic Silicon compoundsSilica, vitreous60676-86-07.20000060.0000000.567186
Inorganic compoundsCarbon Black1333-86-40.0120000.1000000.000945
Subtotal12.000000100.00000000.945310
Total1269.425000100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MCIMX6Q5EYM12AE
Product content declaration of MCIMX6Q5EYM12AE
上次修订 Last Revision (GMT):
Thursday, 21 March 2024, 07:40:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
焊锡球-铅银铜,无铅
Solder Ball - SAC, Lead Free
焊锡球-铅银铜,无铅
Solder Ball - SAC, Lead Free
OOOOOO
基板
Substrate
基板
Substrate
OOOOOO
底注
Underfill
底注
Underfill
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MCIMX6Q5EYM12AELast Revision (GMT):
Thursday, 21 March 2024, 07:40:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Semiconductor DieTest Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Solder Ball - SAC, Lead FreeTest Report
31 May 2023
Test Report
31 May 2023
Test Report
31 May 2023
Test Report
31 May 2023
SubstrateAUS 703Test Report
11 Oct 2023
Test Report
11 Oct 2023
Test Report
11 Oct 2023
Test Report
11 Oct 2023
COPPERTest Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
E679FGTest Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
GX-13Test Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
PHP-900 IR-6Test Report
20 Apr 2023
Test Report
18 Jun 2023
Test Report
20 Apr 2023
Test Report
16 Jul 2020
UnderfillTest Report
12 Oct 2023
Test Report
12 Oct 2023
Test Report
12 Oct 2023
Test Report
12 Oct 2023
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.