MIMXRT1064CVJ5B

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MIMXRT1064CVJ5BLast Revision (GMT):
Thursday, 29 June 2023, 01:50:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MIMXRT1064CVJ5BSOT1968LFBGA196378.711145 mg YesYesYesTin/Silver/Copper (Sn/Ag/Cu)Othere1contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 992 665572023-11-2433 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Tianjin, China;External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuPdAuBonding Wire - CuPdAuCopper and its compoundsCopper, metal7440-50-81.05149297.8000000.277650
Gold and its compoundsGold, metal7440-57-50.0021500.2000000.000568
Palladium and its compoundsPalladium, metal7440-05-30.0215032.0000000.005678
Subtotal1.075145100.00000000.283896
Die EncapsulantDie EncapsulantEpoxy ResinsTetramethylbiphenyl diglycidyl ether85954-11-615.0000008.0000003.960802
Inorganic Silicon compoundsSilica, vitreous60676-86-0153.00000081.60000040.400184
Inorganic Silicon compoundsSilicon dioxide7631-86-915.0000008.0000003.960802
Inorganic compoundsCarbon Black1333-86-40.7500000.4000000.198040
Phenols and Phenolic ResinsPhenol, polymer with formaldehyde9003-35-43.7500002.0000000.990201
Subtotal187.500000100.000000049.510030
Semiconductor Die 1Semiconductor DieInorganic Silicon compoundsSilicon7440-21-33.02428098.0000000.798572
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0617202.0000000.016297
Subtotal3.086000100.00000000.814869
Semiconductor Die 2Semiconductor DieInorganic Silicon compoundsSilicon7440-21-30.83300098.0000000.219957
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0170002.0000000.004489
Subtotal0.850000100.00000000.224445
Solder Ball - SAC, Lead FreeSolder Ball - SAC, Lead FreeCopper and its compoundsCopper, metal7440-50-850.23500098.50000013.264727
Silver and its compoundsSilver, metal7440-22-40.5100001.0000000.134667
Tin and its compoundsTin, metal7440-31-50.2550000.5000000.067334
Subtotal51.000000100.000000013.466728
SubstrateSubstrateAcrylatesProprietary Material-Other acrylates7.6575935.6639002.022014
Barium and its compoundsBarium sulfate7727-43-76.5636904.8548001.733165
Copper and its compoundsCopper, metal7440-50-861.97770845.84150016.365430
Cyanide compoundsPhthalocyanine Blue57455-37-50.1203280.0890000.031773
Inorganic Silicon compoundsFibrous-glass-wool65997-17-324.98225618.4780006.596652
Inorganic Silicon compoundsSilica, vitreous60676-86-00.2187540.1618000.057763
Inorganic Silicon compoundsSilicon dioxide7631-86-92.9146422.1558000.769621
Magnesium and its compoundsTalc14807-96-60.6563960.4855000.173324
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.8422960.6230000.222411
Organic compoundsProprietary Material-Other organic compounds.0.1203280.0890000.031773
PolymersOther acrylic resins29.14601021.5577007.696106
Subtotal135.200000100.000000035.700032
Total378.711145100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MIMXRT1064CVJ5B
Product content declaration of MIMXRT1064CVJ5B
上次修订 Last Revision (GMT):
Thursday, 29 June 2023, 01:50:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
键合线-铜钯金
Bonding Wire - CuPdAu
键合线-铜钯金
Bonding Wire - CuPdAu
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
焊锡球-铅银铜,无铅
Solder Ball - SAC, Lead Free
焊锡球-铅银铜,无铅
Solder Ball - SAC, Lead Free
OOOOOO
基板
Substrate
基板
Substrate
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MIMXRT1064CVJ5BLast Revision (GMT):
Thursday, 29 June 2023, 01:50:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuPdAuTest Report
25 Dec 2023
Test Report
25 Dec 2023
Test Report
25 Dec 2023
Test Report
25 Dec 2023
Die EncapsulantTest Report
5 Jul 2023
Test Report
5 Jul 2023
Test Report
5 Jul 2023
Test Report
5 Jul 2023
Semiconductor Die 1Test Report
14 Jul 2023
Test Report
14 Jul 2023
Test Report
14 Jul 2023
Test Report
14 Jul 2023
Semiconductor Die 2Test Report
14 Sep 2021
Test Report
14 Sep 2021
Test Report
14 Sep 2021
Test Report
14 Sep 2021
Solder Ball - SAC, Lead FreeTest Report
2 Oct 2023
Test Report
2 Oct 2023
Test Report
2 Oct 2023
Test Report
2 Oct 2023
SubstrateAU PLATINGTest Report
6 May 2022
Test Report
6 May 2022
Test Report
6 May 2022
Test Report
6 May 2022
AUS 308Test Report
10 Jul 2023
Test Report
10 Jul 2023
Test Report
10 Jul 2023
Test Report
10 Jul 2023
CU FOILTest Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
CU PLATINGTest Report
23 Apr 2021
Test Report
23 Apr 2021
Test Report
23 Apr 2021
Test Report
23 Apr 2021
E679FG SERIESTest Report
7 Dec 2023
Test Report
7 Dec 2023
Not AvailableNot Available
E679FGB SERIESNot AvailableNot AvailableTest Report
7 Dec 2023
Test Report
7 Dec 2023
NI PLATINGTest Report
5 Mar 2021
Test Report
5 Mar 2021
Test Report
5 Mar 2021
Test Report
5 Mar 2021
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.