MK51DX256ZCLL10

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MK51DX256ZCLL10Last Revision (GMT):
Tuesday, 17 May 2022, 03:54:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MK51DX256ZCLL10SOT407-3LQFP100216.932512 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 200 695572020-06-1973 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia;External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuBonding Wire - CuCopper and its compoundsCopper, metal7440-50-80.73243999.9900000.337634
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000730.0100000.000034
Subtotal0.732512100.00000000.337668
Copper Lead-FrameCopper AlloyCopper and its compoundsCopper, metal7440-50-8152.95105695.01600070.506285
Inorganic Silicon compoundsSilicon7440-21-31.1751100.7300000.541694
Iron and its compoundsIron, metal7439-89-60.2044370.1270000.094240
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0482920.0300000.022261
Magnesium and its compoundsMagnesium, metal7439-95-40.2849240.1770000.131342
Manganese and its compoundsManganese, metal7439-96-50.0965840.0600000.044523
Nickel and its compoundsNickel, metal7440-02-05.1994603.2300002.396810
Zinc and its compoundsZinc, metal7440-66-61.0141360.6300000.467489
Subtotal160.974000100.000000074.204645
Silver PlatingMiscellaneous substancesProprietary Material-Other miscellaneous substances.0.0001630.0100000.000075
Silver and its compoundsSilver, metal7440-22-41.62583799.9900000.749467
Subtotal1.626000100.00000000.749542
Die EncapsulantDie EncapsulantEpoxy ResinsEpoxy resin, EPON Resin 809125928-94-30.1100005.0000000.050707
Inorganic Silicon compoundsSilica, vitreous60676-86-01.65000075.0000000.760605
Inorganic Silicon compoundsSilicon dioxide7631-86-90.2090009.5000000.096343
Inorganic compoundsCarbon Black1333-86-40.0110000.5000000.005071
Organic Silicon compoundsSilicone modified epoxy resin218163-11-20.1100005.0000000.050707
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.1100005.0000000.050707
Subtotal2.200000100.00000001.014140
Epoxy AdhesiveEpoxy AdhesiveMiscellaneous substancesOther miscellaneous substances (less than 10%).0.2002009.1000000.092287
PolymersOther acrylic resins0.1870008.5000000.086202
PolymersPlastic: EP - Epoxide, Epoxy0.0286001.3000000.013184
PolymersPlastic: PBR - Polybutadiene Rubber0.1056004.8000000.048679
Silver and its compoundsSilver, metal7440-22-41.67860076.3000000.773789
Subtotal2.200000100.00000001.014140
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0019800.0200000.000913
Tin and its compoundsTin, metal7440-31-59.89802099.9800004.562719
Subtotal9.900000100.00000004.563631
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon, doped38.51400098.00000017.753909
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.7860002.0000000.362325
Subtotal39.300000100.000000018.116233
Total216.932512100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MK51DX256ZCLL10
Product content declaration of MK51DX256ZCLL10
上次修订 Last Revision (GMT):
Tuesday, 17 May 2022, 03:54:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铜
Bonding Wire - Cu
焊丝-铜
Bonding Wire - Cu
OOOOOO
铜引线框架
Copper Lead-Frame
铜合金
Copper Alloy
OOOOOO

镀银
Silver Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MK51DX256ZCLL10Last Revision (GMT):
Tuesday, 17 May 2022, 03:54:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuTest Report
22 Apr 2021
Test Report
22 Apr 2021
Test Report
22 Apr 2021
Test Report
22 Apr 2021
Copper Lead-FrameAG PLATINGTest Report
10 Nov 2021
Test Report
10 Nov 2021
Test Report
10 Nov 2021
Test Report
10 Nov 2021
C7025Test Report
10 Nov 2021
Test Report
10 Nov 2021
Test Report
10 Nov 2021
Test Report
10 Nov 2021
Die EncapsulantTest Report
20 Apr 2021
Test Report
20 Apr 2021
Test Report
20 Apr 2021
Test Report
20 Apr 2021
Epoxy AdhesiveTest Report
19 Jul 2021
Test Report
19 Jul 2021
Test Report
19 Jul 2021
Test Report
19 Jul 2021
Post-plating - Lead FreeTest Report
23 Jul 2021
Test Report
23 Jul 2021
Test Report
23 Jul 2021
Test Report
23 Jul 2021
Semiconductor DieTest Report
23 Jul 2021
Test Report
23 Jul 2021
Test Report
23 Jul 2021
Not Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.