MMA5148KTWR2

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MMA5148KTWR2Last Revision (GMT):
Wednesday, 18 June 2025, 04:15:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MMA5148KTWR2SOT1574HQFN16174.486045 mg YesNoYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 207 595282025-04-158Not ApplicableNot ApplicableNot Applicable3 / 168 hours26040 sec.3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuPdAuBonding Wire - CuPdAuCopper and its compoundsCopper, metal7440-50-80.18565797.6450000.106402
Gold and its compoundsGold, metal7440-57-50.0004850.2550000.000278
Palladium and its compoundsPalladium, metal7440-05-30.0039932.1000000.002288
Subtotal0.190135100.00000000.108969
Copper Lead-FrameCopper AlloyCopper and its compoundsCopper, metal7440-50-855.09394797.29100031.574988
Iron and its compoundsIron, metal7439-89-61.3420842.3700000.769164
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0096270.0170000.005517
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.0940030.1660000.053874
Tin and its compoundsTin, metal7440-31-50.0169880.0300000.009736
Zinc and its compoundsZinc, metal7440-66-60.0713510.1260000.040892
Subtotal56.628000100.000000032.454171
Silver PlatingMiscellaneous substancesProprietary Material-Other miscellaneous substances.0.0000570.0100000.000033
Silver and its compoundsSilver, metal7440-22-40.57194399.9900000.327787
Subtotal0.572000100.00000000.327820
Die EncapsulantDie EncapsulantInorganic Silicon compoundsSilica, vitreous60676-86-074.82224077.20000042.881504
Inorganic Silicon compoundsSilicon dioxide7631-86-99.5950809.9000005.499053
Inorganic compoundsCarbon Black1333-86-40.4846000.5000000.277730
Organic Phosphorus compoundsOther organic phosphorous compounds0.1938400.2000000.111092
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins4.4583204.6000002.555115
PolymersPlastic: EP - Epoxide, Epoxy7.3659207.6000004.221495
Subtotal96.920000100.000000055.545989
Epoxy Adhesive 1Epoxy AdhesiveEpoxy ResinsPhenolic Polymer Resin, Epikote 1559003-36-50.02700015.0000000.015474
Glycidyl ethersP-Tertbutylphenyl glycidyl ether3101-60-80.0126007.0000000.007221
Glycol Ethers and Acetates - Specific2-butoxyethyl acetate112-07-20.0018001.0000000.001032
Guanidine compounds1-cyanoguanidine461-58-50.0018001.0000000.001032
Organic compoundsProprietary Material-Other organic compounds.0.0018001.0000000.001032
Silver and its compoundsSilver, metal7440-22-40.13500075.0000000.077370
Subtotal0.180000100.00000000.103160
Epoxy Adhesive 2Epoxy AdhesiveAnhydridesPolybutadiene adducted with maleic anhydride25655-35-00.0011000.5000000.000630
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0011000.5000000.000630
Organic compoundsOther Bismaleimides0.10780049.0000000.061781
PolymersPolytetrafluoroethylene9002-84-00.08800040.0000000.050434
Titanium and its compoundsTitanium (IV) Oxide13463-67-70.02200010.0000000.012608
Subtotal0.220000100.00000000.126084
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0004820.0200000.000276
Tin and its compoundsTin, metal7440-31-52.40951899.9800001.380923
Subtotal2.410000100.00000001.381199
Semiconductor Die 1Semiconductor DieInorganic Silicon compoundsSilicon, doped7.84000098.0000004.493196
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1600002.0000000.091698
Subtotal8.000000100.00000004.584894
Semiconductor Die 2DieInorganic Silicon compoundsSilicon7440-21-39.13269998.0000005.234057
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1863822.0000000.106817
Subtotal9.319080100.00000005.340874
GlassAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-10.0004681.0000000.000268
Boron and its compoundsBoron oxide1303-86-20.0037468.0000000.002147
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0014053.0000000.000805
Lead and its compoundsLead monooxide1317-36-80.02505453.5000000.014359
Lead and its compoundsLead titanium oxide (PbTiO3)12060-00-30.01615634.5000000.009259
Subtotal0.046830100.00000000.026839
Total174.486045100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MMA5148KTWR2
Product content declaration of MMA5148KTWR2
上次修订 Last Revision (GMT):
Wednesday, 18 June 2025, 04:15:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
键合线-铜钯金
Bonding Wire - CuPdAu
键合线-铜钯金
Bonding Wire - CuPdAu
OOOOOO
铜引线框架
Copper Lead-Frame
铜合金
Copper Alloy
OOOOOO

镀银
Silver Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 1
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 2
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Die
OOOOOO

玻璃
Glass
XOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品的环保使用期限(EFUP)为50年。
Remark: This semiconductor product has an environmental friendly use period (EFUP) of 50 years.
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MMA5148KTWR2Last Revision (GMT):
Wednesday, 18 June 2025, 04:15:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuPdAuTest Report
24 Mar 2025
Test Report
24 Mar 2025
Test Report
24 Mar 2025
Test Report
24 Mar 2025
Copper Lead-FrameAG PLATINGTest Report
24 Oct 2024
Test Report
24 Oct 2024
Test Report
24 Oct 2024
Test Report
24 Oct 2024
CDA 194Test Report
24 Oct 2024
Test Report
24 Oct 2024
Test Report
24 Oct 2024
Test Report
24 Oct 2024
Die EncapsulantTest Report
13 Feb 2025
Test Report
13 Feb 2025
Test Report
13 Feb 2025
Test Report
13 Feb 2025
Epoxy Adhesive 1Test Report
7 Dec 2017
Test Report
7 Dec 2017
Test Report
7 Dec 2017
Test Report
7 Dec 2017
Epoxy Adhesive 2Test Report
9 Aug 2024
Test Report
9 Aug 2024
Test Report
9 Aug 2024
Test Report
9 Aug 2024
Post-plating - Lead FreeTest Report
21 May 2025
Test Report
21 May 2025
Test Report
21 May 2025
Test Report
21 May 2025
Semiconductor Die 1Test Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
Semiconductor Die 2CAP DIETest Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
LEAD GLASS FRIT DIETest Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.