Model 11

Software Details

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Features

  • Mobility reduction
  • Bias-dependent series resistance
  • Velocity saturation
  • Conductance effects (CLM, DIBL, etc.)
  • Gate leakage current
  • Gate-induced drain leakage
  • Gate depletion
  • Quantum-mechanical effects
  • Bias-dependent overlap capacitances

Downloads

1 download

Note: For better experience, software downloads are recommended on desktop.

Design Resources

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Documentation

Quick reference to our documentation types.

3 documents

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