MC7448VU800ND

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NXP Semiconductors
Product content declaration of MC7448VU800NDLast Revision (GMT):
Friday, 01 July 2022, 12:00:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MC7448VU800NDSOT1603-3CBGA3602151.819300 mg YesNoYesNickel/Gold (Ni/Au)Othere2contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 251 491572022-06-298Not ApplicableNot ApplicableNot Applicable1 / Unlimited26040 sec.3Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
CapacitorCapacitorBarium and its compoundsBarium titanate12047-27-753.36640065.4000002.480059
Copper and its compoundsCopper, metal7440-50-811.26080013.8000000.523315
Nickel and its compoundsNickel, metal7440-02-015.91200019.5000000.739467
Tin and its compoundsTin, metal7440-31-51.0608001.3000000.049298
Subtotal81.600000100.00000003.792140
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon, doped114.52317089.1000005.322156
Lead and its compoundsLead, metallic lead and lead alloys7439-92-112.1048819.4177000.562542
Miscellaneous substancesOther miscellaneous substances (less than 10%).1.1568000.9000000.053759
Nickel and its compoundsNickel, metal7440-02-00.1060400.0825000.004928
Tin and its compoundsTin, metal7440-31-50.6370110.4956000.029603
Titanium and its compoundsTitanium, metal7440-32-60.0053980.0042000.000251
Subtotal128.533300100.00000005.973238
Solder FluxSolder FluxCopper and its compoundsCopper, metal7440-50-848.54915096.5000002.256191
Silver and its compoundsSilver, metal7440-22-41.5093003.0000000.070141
Tin and its compoundsTin, metal7440-31-50.2515500.5000000.011690
Subtotal50.310000100.00000002.338021
Substrate, Pre-plated NiAuSubstrate, Pre-plated NiAuAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-145.2635852.4364002.103503
Barium and its compoundsBarium oxide1304-28-5269.78501414.52170012.537531
Barium and its compoundsBarium titanate12047-27-799.6155585.3620004.629365
Boron and its compoundsBoron oxide1303-86-259.4423613.1996002.762423
Calcium and its compoundsCalcium monoxide1305-78-832.8794511.7698001.527984
Chromium and Chromium III compoundsDichromium trioxide1308-38-95.7424780.3091000.266866
Copper and its compoundsCopper, metal7440-50-8265.13492614.27140012.321431
Copper and its compoundsCuprous oxide1317-39-11.4360840.0773000.066738
Gold and its compoundsGold, metal7440-57-51.6906030.0910000.078566
Inorganic Silicon compoundsSilicon dioxide7631-86-91002.65232553.96970046.595563
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0185780.0010000.000863
Nickel and its compoundsNickel, metal7440-02-022.8807391.2316001.063321
Palladium and its compoundsPalladium, metal7440-05-30.1467670.0079000.006821
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-01.1629870.0626000.054047
Silver and its compoundsSilver, metal7440-22-40.4793140.0258000.022275
Strontium and its compoundsStrontium Oxide1314-11-03.5892810.1932000.166802
Tin and its compoundsTin, metal7440-31-517.3128940.9319000.804570
Zirconium and its compoundsZirconium oxide1314-23-428.5730561.5380001.327856
Subtotal1857.806000100.000000086.336525
UnderfillUnderfillAnhydridesMethylhexahydrophthalic anhydride25550-51-05.07125215.1065000.235673
Epoxy Resins1,6-Bis(2,3-epoxypropoxy) naphthalene27610-48-61.8696815.5695000.086888
Epoxy ResinsElastomer Modified Diglycidyl Ether68909-14-81.8696815.5695000.086888
Epoxy ResinsNeopentyl glycol diglycidyl ether17557-23-21.8696815.5695000.086888
Inorganic Silicon compoundsQuartz14808-60-721.91385865.2781001.018388
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.9758462.9069000.045350
Subtotal33.570000100.00000001.560075
Total2151.819300100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MC7448VU800ND
Product content declaration of MC7448VU800ND
上次修订 Last Revision (GMT):
Friday, 01 July 2022, 12:00:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
电容器
Capacitor
电容器
Capacitor
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
XOOOOO
助焊剂
Solder Flux
助焊剂
Solder Flux
OOOOOO
基板,镍金预镀
Substrate, Pre-plated NiAu
基板,镍金预镀
Substrate, Pre-plated NiAu
OOOOOO
底注
Underfill
底注
Underfill
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品的环保使用期限(EFUP)为50年。
Remark: This semiconductor product has an environmental friendly use period (EFUP) of 50 years.
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MC7448VU800NDLast Revision (GMT):
Friday, 01 July 2022, 12:00:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
CapacitorCERAMICTest Report
27 Dec 2021
Test Report
27 Dec 2021
Test Report
27 Dec 2021
Test Report
27 Dec 2021
INNER ELECTRODETest Report
21 Oct 2021
Test Report
21 Oct 2021
Test Report
21 Oct 2021
Test Report
21 Oct 2021
NI PLATINGTest Report
25 Jun 2021
Test Report
25 Jun 2021
Test Report
25 Jun 2021
Test Report
25 Jun 2021
OUTER ELECTRODETest Report
21 Oct 2021
Test Report
21 Oct 2021
Test Report
21 Oct 2021
Test Report
21 Oct 2021
SN PLATINGTest Report
4 Jun 2021
Test Report
4 Jun 2021
Test Report
4 Jun 2021
Test Report
4 Jun 2021
Semiconductor DieTest Report
17 Sep 2021
Test Report
17 Sep 2021
Test Report
17 Sep 2021
Test Report
17 Sep 2021
Solder FluxTest Report
11 Aug 2021
Test Report
11 Aug 2021
Test Report
11 Aug 2021
Test Report
11 Aug 2021
Substrate, Pre-plated NiAuCOPPER FOILTest Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
E679FG SERIESTest Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
Test Report
21 Dec 2021
UnderfillNot AvailableNot AvailableNot AvailableNot Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.