PCAL6416AEX1Z

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of PCAL6416AEX1ZLast Revision (GMT):
Wednesday, 14 October 2026, 09:41:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
PCAL6416AEX1ZSOT1895X2QFN243.733205 mg YesYesYesNickel/Palladium/Gold (Ni/Pd/Au)Cu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 340 351472023-11-25F1 / Unlimited26030 sec.1 / Unlimited24020 sec.3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuBonding Wire - AuGold and its compoundsGold, metal7440-57-50.00291499.9900000.078075
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000008
Subtotal0.002915100.00000000.078083
Copper Lead-Frame, Pre-Plated NiPdAuCopper AlloyChromium and Chromium III compoundsChromium, metal7440-47-30.0023560.1540000.063115
Copper and its compoundsCopper, metal7440-50-81.52325799.55900040.802929
Tin and its compoundsTin, metal7440-31-50.0031360.2050000.084016
Zinc and its compoundsZinc, metal7440-66-60.0012550.0820000.033607
Subtotal1.530004100.000000040.983667
Gold PlatingGold and its compoundsGold, metal7440-57-50.00099999.9900000.026784
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000003
Subtotal0.001000100.00000000.026787
Mold CompoundEpoxy ResinsTetramethylbiphenyl diglycidyl ether85954-11-60.04930815.0000001.320805
Inorganic Silicon compoundsSilica, vitreous60676-86-00.24489874.5000006.559996
Inorganic compoundsCarbon Black1333-86-40.0016440.5000000.044027
Phenols and Phenolic ResinsPhenol, polymer with formaldehyde9003-35-40.03287210.0000000.880536
Subtotal0.328722100.00000008.805364
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000040.0100000.000105
Nickel and its compoundsNickel, metal7440-02-00.03926999.9900001.051897
Subtotal0.039273100.00000001.052002
Palladium PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000003
Palladium and its compoundsPalladium, metal7440-05-30.00099999.9900000.026784
Subtotal0.001000100.00000000.026787
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins0.0650005.0000001.741131
Inorganic Silicon compoundsSilica, vitreous60676-86-01.13100087.00000030.295684
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0650005.0000001.741131
Inorganic compoundsCarbon Black1333-86-40.0039000.3000000.104468
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.0351002.7000000.940211
Subtotal1.300000100.000000034.822626
Epoxy AdhesiveEpoxy AdhesiveEpoxy ResinsEpichlorohydrin, o-cresol, formaldehyde polymer29690-82-20.0210007.0000000.562519
Epoxy ResinsPhenolic Polymer Resin, Epikote 1559003-36-50.04200014.0000001.125039
Inorganic Silicon compoundsSilicon dioxide7631-86-90.15000050.0000004.017995
Phenols and Phenolic ResinsPhenol, polymer with formaldehyde9003-35-40.04200014.0000001.125039
PolymersCopolymer of ethylacrylate, buthylacrylate, acrylnitrile, glycidylmethacrylate58152-79-70.04500015.0000001.205399
Subtotal0.300000100.00000008.035991
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-30.22568498.0000006.045320
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0046062.0000000.123374
Subtotal0.230290100.00000006.168694
Total3.733205100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 PCAL6416AEX1Z
Product content declaration of PCAL6416AEX1Z
上次修订 Last Revision (GMT):
Wednesday, 14 October 2026, 09:41:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
焊丝-金
Bonding Wire - Au
焊丝-金
Bonding Wire - Au
OOOOOOOOOO
铜引线框架,预镀镍钯金
Copper Lead-Frame, Pre-Plated NiPdAu
铜合金
Copper Alloy
OOOOOOOOOO

镀金材料
Gold Plating
OOOOOOOOOO

模塑料
Mold Compound
OOOOOOOOOO

镀镍层
Nickel Plating
OOOOOOOOOO

钯镀层
Palladium Plating
OOOOOOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of PCAL6416AEX1ZLast Revision (GMT):
Wednesday, 14 October 2026, 09:41:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
21 Apr 2026
Test Report
21 Apr 2026
Test Report
21 Apr 2026
Test Report
21 Apr 2026
Copper Lead-Frame, Pre-Plated NiPdAuAU PLATINGTest Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
CV8715Test Report
15 Apr 2026
Test Report
15 Apr 2026
Test Report
15 Apr 2026
Test Report
15 Apr 2026
EFTEC64TTest Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
NI PLATINGTest Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
PD PLATINGTest Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
Test Report
5 Aug 2026
Die EncapsulantTest Report
7 May 2026
Test Report
7 May 2026
Test Report
7 May 2026
Test Report
7 May 2026
Epoxy AdhesiveTest Report
5 Nov 2025
Test Report
5 Nov 2025
Test Report
5 Nov 2025
Test Report
5 Nov 2025
Semiconductor DieTest Report
5 Jun 2026
Test Report
5 Jun 2026
Test Report
5 Jun 2026
Test Report
5 Jun 2026
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.