Automotive Functional Safety: The Evolution of Fail Safe to Fail Operational Architecture

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Author

Jean-Philippe Meunier

Jean-Philippe Meunier

Jean-Philippe Meunier joined NXP in 1999. He holds a Master degrees in Micro-Electronics. With a career in the electronics and semiconductor business focused in the Automotive market, he has held various positions in Product Engineering, Program Management, Application and System Architect. He is now Global Functional Safety Architect for the Safety & Power Management Product Line at NXP.